Patents by Inventor Kenji Hachiya

Kenji Hachiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for adjusting confocal microscope
    Patent number: 7599113
    Abstract: A method for adjusting a confocal microscope which includes a microscope unit and a confocal scanner unit of Nipkow disk type, emits a light beam for image measurement on a sample, images a returned fluorescent light of the light beam by a CCD (charge-coupled device) digital camera as a confocal image, and enables observation of the sample by the confocal image, the method includes matching a phase of rotation of the Nipkow disk with a phase of an exposure time of the CCD digital camera.
    Type: Grant
    Filed: February 26, 2007
    Date of Patent: October 6, 2009
    Assignee: Yokogawa Electric Corporation
    Inventors: Yasuhiro Tanibata, Kenji Hachiya
  • Method for adjusting confocal microscope
    Publication number: 20070216999
    Abstract: A method for adjusting a confocal microscope which includes a microscope unit and a confocal scanner unit of Nipkow disk type, emits a light beam for image measurement on a sample, images a returned fluorescent light of the light beam by a CCD (charge-coupled device) digital camera as a confocal image, and enables observation of the sample by the confocal image, the method includes matching a phase of rotation of the Nipkow disk with a phase of an exposure time of the CCD digital camera.
    Type: Application
    Filed: February 26, 2007
    Publication date: September 20, 2007
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yasuhiro Tanibata, Kenji Hachiya
  • Three-dimensional confocal microscope system
    Patent number: 6982824
    Abstract: The present invention is characterized in that it is possible to provide a three-dimensional confocal microscope system configured so that an objective lens can be scanned in the optical-axis direction using an actuator to obtain sliced confocal images of a sample, wherein the actuator is driven using a scanning waveform signal, which is triangular or step-like and has been corrected so that acceleration is kept virtually constant at discontinuous points of change in the scanning waveform signal, thereby consistently providing sliced confocal images of the sample.
    Type: Grant
    Filed: March 16, 2004
    Date of Patent: January 3, 2006
    Assignee: Yokogawa Electric Corporation
    Inventors: Takayuki Kei, Kenji Hachiya, Kenta Mikuriya
  • Three-dimensional confocal microscope system
    Publication number: 20050012989
    Abstract: The present invention is characterized in that it is possible to provide a three-dimensional confocal microscope system configured so that an objective lens can be scanned in the optical-axis direction using an actuator to obtain sliced confocal images of a sample, wherein the actuator is driven using a scanning waveform signal, which is triangular or step-like and has been corrected so that acceleration is kept virtually constant at discontinuous points of change in the scanning waveform signal, thereby consistently providing sliced confocal images of the sample.
    Type: Application
    Filed: March 16, 2004
    Publication date: January 20, 2005
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takayuki Kei, Kenji Hachiya, Kenta Mikuriya