Patents by Inventor Kenji MARUNO
Kenji MARUNO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230194247Abstract: An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control device 210 controls a movement mechanism 500 to move a measurement probe 160 to a target position of a target to be measured, calculates an error between an actual position of the measurement probe 160 detected by the measurement probe 160 and the target position, corrects the error by moving the measurement probe 160 by the movement mechanism 500 based on the calculated error, and then causes the measurement probe 160 to perform a distance measurement.Type: ApplicationFiled: May 10, 2021Publication date: June 22, 2023Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Kenji MARUNO, Shinya HAMAGISHI, Motoki HARAYAMA
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Patent number: 11644545Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.Type: GrantFiled: July 10, 2019Date of Patent: May 9, 2023Assignee: HITACHI, LTD.Inventors: Kenji Maruno, Masahiro Watanabe, Yuta Urano, Tatsuo Hariyama, Atsushi Taniguchi
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Patent number: 11635295Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.Type: GrantFiled: February 13, 2020Date of Patent: April 25, 2023Assignee: Hitachi, Ltd.Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno, Akio Yazaki
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Publication number: 20220268929Abstract: According to the present invention, a measured distance is corrected in accordance with change in the surrounding environment.Type: ApplicationFiled: June 11, 2020Publication date: August 25, 2022Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
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Patent number: 11421976Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.Type: GrantFiled: June 3, 2021Date of Patent: August 23, 2022Assignee: HITACHI, LTD.Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
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Publication number: 20220178680Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.Type: ApplicationFiled: February 13, 2020Publication date: June 9, 2022Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO, Akio YAZAKI
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Publication number: 20210293524Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.Type: ApplicationFiled: June 3, 2021Publication date: September 23, 2021Applicant: HITACHI, LTD.Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
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Patent number: 11054242Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.Type: GrantFiled: November 25, 2019Date of Patent: July 6, 2021Assignee: HITACHI, LTD.Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
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Patent number: 10900773Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.Type: GrantFiled: May 22, 2018Date of Patent: January 26, 2021Assignee: Hitachi, Ltd.Inventors: Masahiro Watanabe, Tatsuo Hariyama, Atsushi Taniguchi, Kenji Maruno
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Publication number: 20200166327Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.Type: ApplicationFiled: November 25, 2019Publication date: May 28, 2020Applicant: HITACHI, LTD.Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
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Publication number: 20200041259Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.Type: ApplicationFiled: May 22, 2018Publication date: February 6, 2020Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Atsushi TANIGUCHI, Kenji MARUNO
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Publication number: 20200018823Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.Type: ApplicationFiled: July 10, 2019Publication date: January 16, 2020Applicant: HITACHI, LTD.Inventors: Kenji MARUNO, Masahiro WATANABE, Yuta URANO, Tatsuo HARIYAMA, Atsushi TANIGUCHI