Patents by Inventor Kenji MARUNO

Kenji MARUNO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230194247
    Abstract: An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control device 210 controls a movement mechanism 500 to move a measurement probe 160 to a target position of a target to be measured, calculates an error between an actual position of the measurement probe 160 detected by the measurement probe 160 and the target position, corrects the error by moving the measurement probe 160 by the movement mechanism 500 based on the calculated error, and then causes the measurement probe 160 to perform a distance measurement.
    Type: Application
    Filed: May 10, 2021
    Publication date: June 22, 2023
    Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Kenji MARUNO, Shinya HAMAGISHI, Motoki HARAYAMA
  • Patent number: 11644545
    Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: May 9, 2023
    Assignee: HITACHI, LTD.
    Inventors: Kenji Maruno, Masahiro Watanabe, Yuta Urano, Tatsuo Hariyama, Atsushi Taniguchi
  • Patent number: 11635295
    Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: April 25, 2023
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno, Akio Yazaki
  • Publication number: 20220268929
    Abstract: According to the present invention, a measured distance is corrected in accordance with change in the surrounding environment.
    Type: Application
    Filed: June 11, 2020
    Publication date: August 25, 2022
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Patent number: 11421976
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: August 23, 2022
    Assignee: HITACHI, LTD.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
  • Publication number: 20220178680
    Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.
    Type: Application
    Filed: February 13, 2020
    Publication date: June 9, 2022
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO, Akio YAZAKI
  • Publication number: 20210293524
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
    Type: Application
    Filed: June 3, 2021
    Publication date: September 23, 2021
    Applicant: HITACHI, LTD.
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Patent number: 11054242
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.
    Type: Grant
    Filed: November 25, 2019
    Date of Patent: July 6, 2021
    Assignee: HITACHI, LTD.
    Inventors: Tatsuo Hariyama, Masahiro Watanabe, Atsushi Taniguchi, Kenji Maruno
  • Patent number: 10900773
    Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.
    Type: Grant
    Filed: May 22, 2018
    Date of Patent: January 26, 2021
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Watanabe, Tatsuo Hariyama, Atsushi Taniguchi, Kenji Maruno
  • Publication number: 20200166327
    Abstract: Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.
    Type: Application
    Filed: November 25, 2019
    Publication date: May 28, 2020
    Applicant: HITACHI, LTD.
    Inventors: Tatsuo HARIYAMA, Masahiro WATANABE, Atsushi TANIGUCHI, Kenji MARUNO
  • Publication number: 20200041259
    Abstract: An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.
    Type: Application
    Filed: May 22, 2018
    Publication date: February 6, 2020
    Inventors: Masahiro WATANABE, Tatsuo HARIYAMA, Atsushi TANIGUCHI, Kenji MARUNO
  • Publication number: 20200018823
    Abstract: A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 16, 2020
    Applicant: HITACHI, LTD.
    Inventors: Kenji MARUNO, Masahiro WATANABE, Yuta URANO, Tatsuo HARIYAMA, Atsushi TANIGUCHI