Patents by Inventor Kenneth C. Gross
Kenneth C. Gross has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7526683Abstract: A method for use in a computer system provides a dynamic, “self tuning” soft-error-rate-discrimination (SERD) method and apparatus. Specially designed SRAMs or other circuits are “tuned” in a manner that gives them extreme susceptibility to cosmic neutron events (soft errors), higher than that of the “regular” SRAM components, memory modules or other components in the computer system. One such specially designed SRAM is deployed per server. An interface algorithm continuously sends read/write traffic to the special SRAM to infer the soft error rate (SER), which is directly proportional to cosmic neutron flux. The inferred cosmic neutron flux rate is employed in a Poisson SPRT algorithmic approach that dynamically compensates the soft error discrimination sensitivity in accordance with the instantaneous neutron flux for all of the regular SRAM components in the server.Type: GrantFiled: June 1, 2005Date of Patent: April 28, 2009Assignee: Sun Microsystems, Inc.Inventors: Lawrence G. Votta, Jr., Kenneth C. Gross, Aleksey M. Urmanov, Douglas B. Meyer
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Patent number: 7359834Abstract: One embodiment of the present invention provides a system that monitors system-calls to identify runaway processes within a computer system. First, the system monitors system-calls on the computer system during runtime, to generate a trace of system-calls made. Then, the system analyzes the trace to detect runaway processes.Type: GrantFiled: March 24, 2006Date of Patent: April 15, 2008Assignee: Sun Microsystems, Inc.Inventors: Kalyanaraman Vaidyanathan, Sajjit Thampy, Kenneth C. Gross
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Publication number: 20080071433Abstract: A method for inferring an altitude of a computing device, involving monitoring variable data associated with a plurality of variables measured within the computing device, inferring the altitude of the computing device using the measured plurality of variables in a multivariate correlation function, and controlling operation of the computing device based on the inferred altitude.Type: ApplicationFiled: September 15, 2006Publication date: March 20, 2008Applicant: Sun Microsystems, Inc.Inventors: Kenneth C. Gross, Kalyanaraman Vaidyanathan
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Publication number: 20080046559Abstract: A method for performing server monitoring via condition tracking and state identification of server components. In one embodiment, the method includes continuously monitoring a server, the server having a plurality of components, determining whether a component of the plurality of components has entered a maintenance state, and triggering a maintenance action for the component if it has entered the maintenance state.Type: ApplicationFiled: August 16, 2006Publication date: February 21, 2008Inventors: Yuri Langer, Aleksey M. Urmanov, Kenneth C. Gross
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Patent number: 7292659Abstract: One embodiment of the present invention provides a system that facilitates aligning a first signal with a second signal in a manner that optimizes a correlation between the first signal and the second signal. The system starts by receiving a set of signals, including the first signal and the second signal. The system then determines a correlation between the first signal and the second signal. Next, the system adjusts an alignment between the first signal and again determines a correlation between the first signal and the second signal. If the correlation is greater with the alignment adjustment, the system adjusts the alignment between the first signal and the second signal. This process of adjusting the alignment is repeated for different alignments to find an optimal alignment. Hence, the present invention operates effectively for signal sources which may be independently speeding up and slowing down with respect to each other while under surveillance.Type: GrantFiled: September 26, 2003Date of Patent: November 6, 2007Assignee: Sun Microsystems, Inc.Inventors: Kenneth C. Gross, Vatsal Bhardwaj, David M. Fishman, Lawrence G. Votta, Jr.
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Patent number: 7292962Abstract: A technique for detecting changes in a signal that is measured and reported by quantization uses a model that is updated in response to the sampling of quantized values representing the signal. In one stage, (i) frequencies of occurrences of different sampled quantized values in the stage are calculated and (ii) mean frequencies for each of the different sampled quantized values in the stage are calculated and recorded. In a next stage, frequencies of occurrences of different sampled quantized values occurring after an end of the preceding stage are calculated and statistically compared with the mean frequencies of the different sampled quantized values determined in the preceding stage. Dependent on this comparison, a notification may be issued indicating the signal is anomalously changing.Type: GrantFiled: March 25, 2004Date of Patent: November 6, 2007Assignee: Sun Microsystems, Inc.Inventors: Kenneth C. Gross, Keith Whisnant
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Patent number: 7243265Abstract: Methods, systems, and articles of manufacture consistent with the present invention train a real-time health-monitor for a computer-based system while simultaneously monitoring the health of the system. A plurality of signals that each describe an operating condition of a subject data processing system are monitored in real-time. It is determined whether there is a problem with the subject data processing system by comparing at least one of the monitored signals to a corresponding at least one signal in a known signal dataset. The known signal dataset includes a signal value for at least one signal that describes an operating condition of one of a plurality of subject data processing systems. A new signal dataset having an entry for each monitored signal and a corresponding signal value is prepared simultaneously with monitoring the plurality of signals and determining whether there is a problem.Type: GrantFiled: October 22, 2003Date of Patent: July 10, 2007Assignee: Sun Microsystems, Inc.Inventors: Michael J. Wookey, Kenneth C. Gross, Lawrence G. Votta, Jr.
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Patent number: 7171589Abstract: One embodiment of the present invention provides a system that facilitates determining the effects of a temperature variation in a computer system. The system operates by systematically varying the flow of a coolant through the computer system to produce a temperature variation in the computer system while the computer system is operating. While this temperature variation is taking place, the system monitors the computer system to determine effects of the temperature variation on the computer system.Type: GrantFiled: December 17, 2003Date of Patent: January 30, 2007Assignee: Sun Microsystems, Inc.Inventors: Aleksey M. Urmanov, Lawrence G. Votta, Kenneth C. Gross, Su-Jaen Huang
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Patent number: 7085681Abstract: One embodiment of the present invention provides a system that monitors a computer system using a plurality of physical sensors. The system operates by polling the plurality of physical sensors in a given sequence at a given rate, wherein each physical sensor monitors a specific physical parameter of the computer system. The system then provides a plurality of measurements from the plurality of physical sensors to a monitoring system. If a given physical sensor detects a parameter that is not within a pre-determined operating range, the system receives an interrupt from the given physical sensor. In response to receiving this interrupt, the system raises an alarm.Type: GrantFiled: December 22, 2004Date of Patent: August 1, 2006Assignee: SUN Microsystems, Inc.Inventors: Emrys J. Williams, Kenneth C. Gross
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Patent number: 7076389Abstract: One embodiment of the present invention provides a system that validates sensor operability in a computer system. During operation, the system perturbs the computer system with an excitation, wherein the excitation may be physical or software-based. The system then receives a number of responses to the excitation through sensors in the computer system, wherein each response is represented as a value of a variable which may vary with time. Next, the system compares the received responses with a set of reference responses gathered from properly functioning sensors in a reference computer system. The system then determines from the comparison whether the sensors in the computer system are operating properly.Type: GrantFiled: July 26, 2004Date of Patent: July 11, 2006Assignee: SUN Microsystems, Inc.Inventors: Kenneth C. Gross, Eugenio J. Schuster Rosa
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Patent number: 6999899Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: GrantFiled: February 2, 2004Date of Patent: February 14, 2006Assignee: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Patent number: 6930488Abstract: One embodiment of the present invention provides a system that facilitates accelerated Soft-Error Rate (SER) testing of circuitry. The system starts by collecting a radioactive gas from the atmosphere and concentrating the radioactive gas in a testing chamber. Once the desired amount of radioactive gas is present in the testing chamber, the system SER tests the circuitry in the testing chamber by bombarding the circuitry with particles emitted from the radioactive gas while running testing procedures.Type: GrantFiled: December 17, 2003Date of Patent: August 16, 2005Assignee: Sun Microsystems, Inc.Inventors: Kenneth C. Gross, David K. McElfresh
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Patent number: 6872813Abstract: Novel DNA sequences derived from a family of genes encoding ?-galactosidases in tomato are disclosed. ?-Galactosidase II has demonstrated enzyme activity in cell wall disassembly, leading to loss of tissue integrity and fruit softening. Modification of ?-galactosidase II gene expression in plants transformed for expression in the antisense direction results in improvement of the quality of fruit texture and firmness.Type: GrantFiled: June 8, 1999Date of Patent: March 29, 2005Assignee: The United States of America as represented by the Secretary of AgricultureInventors: Kenneth C. Gross, David L. Smith
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Patent number: 6839655Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.Type: GrantFiled: May 25, 2001Date of Patent: January 4, 2005Assignee: University of ChicagoInventors: Kenneth C. Gross, Stephan W. Wegerich
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Patent number: 6804628Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: GrantFiled: May 28, 2002Date of Patent: October 12, 2004Assignee: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Publication number: 20040162685Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: ApplicationFiled: February 2, 2004Publication date: August 19, 2004Applicant: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Patent number: 6553334Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: GrantFiled: May 16, 2001Date of Patent: April 22, 2003Assignee: Arch Development Corp.Inventors: Kenneth C. Gross, Stephan Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Publication number: 20030028349Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.Type: ApplicationFiled: May 25, 2001Publication date: February 6, 2003Inventors: Kenneth C. Gross, Stephan W. Wegerich
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Publication number: 20020188423Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a SPRT methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: ApplicationFiled: May 28, 2002Publication date: December 12, 2002Inventors: Kenneth C. Gross, Stephen W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Publication number: 20020042692Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a SPRT methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: ApplicationFiled: May 16, 2001Publication date: April 11, 2002Inventors: Kenneth C. Gross, Stephan Wegerich, Cynthia Criss, Alan D. Wilks