Abstract: A system and method includes a laser transmitter configured to form a transmitted laser beam and a laser receiver configured to receive a reflected beam based on the transmitted laser beam. An identification (ID)-filter includes a substrate, a retarder filter and a reflector, where the transmitted beam passes through the retarder filter and is reflected back through the retarder filter in an opposite direction, to the laser receiver. A processor connected with a memory executes instructions stored in the memory to determine polarization properties of the reflected beam with respect to the transmitted laser beam to determine an address of the ID-filter.

Abstract: A system and method includes a laser transmitter configured to form a transmitted laser beam and a laser receiver configured to receive a reflected beam based on the transmitted laser beam. An identification (ID)-filter includes a substrate, a retarder filter and a reflector, where the transmitted beam passes through the retarder filter and is reflected back through the retarder filter in an opposite direction, to the laser receiver. A processor connected with a memory executes instructions stored in the memory to determine polarization properties of the reflected beam with respect to the transmitted laser beam to determine an address of the ID-filter.

Abstract: A computer may include a database and a power reducing routine. The database may be configured to store an input power level of an input laser beam transmitted onto and storing power within a gain module. The database may be further configured to store a discharge power level of at least partially discharged stored power discharged from the gain module through an output laser beam. The database may also be configured to store a power safety differential limit. The power reducing routine may include an algorithm. The algorithm may be configured to calculate a power differential by subtracting the discharge power level from the input power level, and to at least one of reduce power to and shut down the input laser beam if the calculated power differential exceeds the power safety differential limit.

Abstract: A computer may include a database and a power reducing routine. The database may be configured to store an input power level of an input laser beam transmitted onto and storing power within a gain module. The database may be further configured to store a discharge power level of at least partially discharged stored power discharged from the gain module through an output laser beam. The database may also be configured to store a power safety differential limit. The power reducing routine may include an algorithm. The algorithm may be configured to calculate a power differential by subtracting the discharge power level from the input power level, and to at least one of reduce power to and shut down the input laser beam if the calculated power differential exceeds the power safety differential limit.

Abstract: A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the 1/e2 radius of the near field intensity. The beam quality is determined by taking the square root of the ratio of the theoretical power through a bucket and the actual power through a pinhole with the same size as the bucket. The beam quality of different types of beam profiles can be obtained with a single method or measure.

Abstract: A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the 1/e2 radius of the near field intensity. The beam quality is determined by taking the square root of the ratio of the theoretical power through a bucket and the actual power through a pinhole with the same size as the bucket. The beam quality of different types of beam profiles can be obtained with a single method or measure.

Abstract: A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the 1/e2 radius of the near field intensity. The beam quality is determined by taking the square root of the ratio of the theoretical power through a bucket and the actual power through a pinhole with the same size as the bucket. The beam quality of different types of beam profiles can be obtained with a single method or measure.

Abstract: A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the 1/e2 radius of the near field intensity. The beam quality is determined by taking the square root of the ratio of the theoretical power through a bucket and the actual power through a pinhole with the same size as the bucket. The beam quality of different types of beam profiles can be obtained with a single method or measure.

Abstract: A heterodyne lateral grating interferometer having a laser signal received by an AOM which generates several defracted order beams including a zero order beam and higher order beams. A lens system reimages the defracted order beams onto a stationary phase grating. An RF drive signal is received by the AOM such that the spatial frequency of the traveling phase grating of the AOM is responsive to the frequency of the RF drive signal, and the optical phase modulation depth of the traveling phase grating is responsive to the power of the RF drive signal. A phase detector determines the phase of the zero order beam from the stationary phase grating with respect to the phase of the RF drive signal.

Abstract: A heterodyne lateral grating interferometer having a laser signal received by an AOM which generates several defracted order beams including a zero order beam and higher order beams. A lens system reimages the defracted order beams onto a stationary phase grating. An RF drive signal is received by the AOM such that the spatial frequency of the traveling phase grating of the AOM is responsive to the frequency of the RF drive signal, and the optical phase modulation depth of the traveling phase grating is responsive to the power of the RF drive signal. A phase detector determines the phase of the zero order beam from the stationary phase grating with respect to the phase of the RF drive signal.

Abstract: A method and apparatus for testing an optical system 64 having an optical axis and a desired optical wavefront. A hologram is formed containing a recording of the desired optical wavefront. The hologram is located on the optical axis. When the hologram 50 is played back, the desired optical wavefront 62 is produced and directed toward the optical system 64. Wavefront 62 is retroreflected from the optical system 64 containing any of the system's aberrations. The retroreflected wavefront 66 is then passed through the hologram. A reference wavefront 60 is produced which is substantially conjugate to the desired optical wavefront. The reference wavefront 60 interferes with the retroreflected desired optical wavefront 66 thereby producing an interference fringe pattern characterizing the optical system under test.