Patents by Inventor Kenneth H. Wong

Kenneth H. Wong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9841449
    Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.
    Type: Grant
    Filed: November 30, 2015
    Date of Patent: December 12, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: Michael Mikulka, Richard Lynn Rhymes, Hassan Tanbakuchi, Chen-Yu Chi, Kenneth H. Wong, Thomas Zwick
  • Patent number: 9835677
    Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.
    Type: Grant
    Filed: December 20, 2010
    Date of Patent: December 5, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: Kenneth H. Wong, Robert E. Shoulders, Joel P. Dunsmore, Thomas Reed, Erwin F. Siegel
  • Publication number: 20170153280
    Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.
    Type: Application
    Filed: November 30, 2015
    Publication date: June 1, 2017
    Inventors: Michael Mikulka, Richard Lynn Rhymes, Hassan Tanbakuchi, Chen-Yu Chi, Kenneth H. Wong, Thomas Zwick
  • Patent number: 9632122
    Abstract: A method determines operating characteristics of a signal generator. The method includes performing a first set of measurements of an output signal generated by the signal generator and corresponding reflected signal, where the first set of measurements is performed over multiple frequencies and amplitudes of the output signal; applying an external signal to the output port of the signal generator; performing a second set of measurements of the output signal and corresponding reflected signal while the external signal is being applied to the output port, where the second set of measurements is performed over frequencies and amplitudes of the output signal, the external signal having the same frequency as the output signal for each measurement of the second set of measurements. A set of coefficients describing the operating characteristics of the signal generator is determined by processing results of the first and second sets of measurements through a non-linear model.
    Type: Grant
    Filed: June 23, 2014
    Date of Patent: April 25, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: Loren C. Betts, David V. Blackham, Michael C. Dobbert, Xiaolong Li, Dara Sariaslani, Lisa Shenton, Erwin F. Siegel, Bernadette Smith, Matt Todhunter, Kenneth H. Wong
  • Publication number: 20150369849
    Abstract: A method determines operating characteristics of a signal generator. The method includes performing a first set of measurements of an output signal generated by the signal generator and corresponding reflected signal, where the first set of measurements is performed over multiple frequencies and amplitudes of the output signal; applying an external signal to the output port of the signal generator; performing a second set of measurements of the output signal and corresponding reflected signal while the external signal is being applied to the output port, where the second set of measurements is performed over frequencies and amplitudes of the output signal, the external signal having the same frequency as the output signal for each measurement of the second set of measurements. A set of coefficients describing the operating characteristics of the signal generator is determined by processing results of the first and second sets of measurements through a non-linear model.
    Type: Application
    Filed: June 23, 2014
    Publication date: December 24, 2015
    Inventors: Loren C. Betts, David V. Blackham, Michael C. Dobbert, Xiaolong Li, Dara Sariaslani, Lisa Shenton, Erwin F. Siegel, Bernadette Smith, Matt Todhunter, Kenneth H. Wong
  • Publication number: 20120153933
    Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.
    Type: Application
    Filed: December 20, 2010
    Publication date: June 21, 2012
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Kenneth H. Wong, Robert E. Shoulders, Joel P. Dunsmore, Thomas Reed, Erwin F. Siegel
  • Patent number: 7652484
    Abstract: In one method of calibrating an instrument having N ports, where N>=2, cables of a first type are characterized by connecting a first cable between two of the ports; performing an “unknown-thru” full two-port calibration between the two ports; obtaining a S-parameter of the first cable; saving the S-parameter of the first cable; and then repeating the connecting, performing, obtaining and saving for additional cables having the first type. The cables having the first type are then disconnected from one of the two ports and a measurement plane is transferred from the connected end of the cable to the disconnected end of the cable. Cables of a second type are then characterized by connecting a second cable between the second of the two ports and the disconnected end of the first cable; measuring a S-parameter of the second cable; and saving the S-parameter of the second cable.
    Type: Grant
    Filed: February 22, 2007
    Date of Patent: January 26, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth H. Wong, James C. Liu, Keith F. Anderson, Bobby Y. Wong
  • Publication number: 20080204039
    Abstract: The present invention is a method to allow a vector network analyzer (VNA) to self calibrate without the addition of calibration standards, e.g. a calibration kit with a network analyzer.
    Type: Application
    Filed: February 22, 2007
    Publication date: August 28, 2008
    Inventors: Kenneth H. Wong, James C. Liu, Keith F. Anderson, Bobby Y. Wong
  • Publication number: 20080020726
    Abstract: A vector network analyzer with one or more ports having each port comprising of an N-port signal separating network, where N>=6, an intermediate frequency (IF) filter interposing an RF downconverter and a power detector. The RF downconverter may be N-2 mixers or N-2 samplers. The IF downconverter (comprising N-2 IF filters and power detectors) may also be realized by an AID converter having N-2 inputs connected to a digital signal processor.
    Type: Application
    Filed: July 14, 2006
    Publication date: January 24, 2008
    Inventors: David V. Blackham, Kenneth H. Wong, Keith F. Anderson, Hassan Tanbakuchi
  • Patent number: 7248033
    Abstract: A Vector Network Analyzer is equipped with receivers for measuring a1, b1, a2 and b2 and which can each be tuned to track either the RF signal (F1) applied to the FTD or to the IF (F2) produced by the FTD. Additional forward side and reverse side mixers are provided and are driven by the auxiliary LO for the FTD. The additional mixers can be located in the RF/IF path, such that there is a sequential double conversion of the RF/IF: one by the auxiliary LO followed by another conversion of those results by the main LO. The additional mixers could also be located it the LO path, such that the main LO is first converted to an image involving the auxiliary LO, and the RF/IF is then subsequently converted using that image as an ‘artificial’ LO. During a forward direction measurement of an FTD, the applied RF signal (F1) is converted to the IF with the additional forward side mixers that feeds the receivers for a1 and b1.
    Type: Grant
    Filed: October 18, 2004
    Date of Patent: July 24, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Keith F. Anderson, Richard R. Hawkins, James C. Lui, Kenneth H. Wong
  • Patent number: 7221245
    Abstract: An adaptor includes a connector interface having a first coaxial structure with a first center pin configured to be coupled to a first center conductor of a first coaxial transmission line and a second coaxial structure with a second center pin configured to be coupled to a second center conductor of a second coaxial transmission line. A nut surrounds the first coaxial structure and the second coaxial structure.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: May 22, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Hassan Tanbakuchi, Paul E. Cassanego, Kenneth H. Wong
  • Patent number: 7168979
    Abstract: A coaxial connector including an outer conductor, a glass to metal seal (GMS) assembly, and a center conductor, is disclosed. The outer conductor has a tubular shape and defines longitudinal axis. Here, the center conductor and the GMS assembly are coupled before they are placed within the outer conductor. When the GMS assembly is coaxially placed within the outer conductor, the GMS assembly and the outer conductor define a variable gap enclosure. Fusing agent such as solder is placed within the variable gap enclosure. A bead is inserted into the outer conductor surrounding the center conductor and engaging the center conductor at a circumferential slot. The slide-on dielectric bead provides support for the center conductor and maintains the center conductor's position within the outer conductor and its characteristic impedance throughout.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: January 30, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Paul E. Cassanego, Tan Boon Khim, Michael T. Powers, Floyd A. Bishop, Kenneth H. Wong, Matthew R. Richter, Jon L. James
  • Patent number: 7148702
    Abstract: In one embodiment, a vector network analyzer (VNA) comprises a plurality of ports for coupling to a device under test (DUT), at least one reference receiver for measuring signals associated with the DUT, and logic for processing measurement data from the at least one reference receiver to compensate for transmission line effects, wherein the logic for processing evaluates a function, of several controllable variables, that is a sum of multiple transmission line models, wherein each of the controllable variables is related to a respective transmission line length associated with a corresponding transmission line model.
    Type: Grant
    Filed: March 30, 2005
    Date of Patent: December 12, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth H. Wong, David V. Blackham, Joel P. Dunsmore
  • Patent number: 7124049
    Abstract: In one embodiment, a method comprises storing parameters that are related to switch error correction terms of a vector network analyzer (VNA), and applying a calibration process of a TRL group of calibration processes to the VNA to generate calibration measurements, wherein the calibration process generates calibration measurements, calculates a switch error correction matrix using the stored parameters and a subset of the calibration measurements, and applies the switch error correction matrix to calibration measurements before solving for eight-systematic error terms associated with the calibration process.
    Type: Grant
    Filed: January 3, 2005
    Date of Patent: October 17, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth H. Wong, David V. Blackham, James C. Liu, Keith F. Anderson
  • Patent number: 7061254
    Abstract: A power calibration method for a multi-port vector network analyzer (VNA) performs a two-port S-parameter calibration between a pair of ports of the multi-port VNA, and performs a power calibration of one of the ports in the pair of ports. From the two-port S-parameter calibration and the power calibration at the one port, power can be determined at one or more ports of a device under test (DUT) coupled to the ports of the multi-port VNA.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: June 13, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Robert Edward Shoulders, David VerNon Blackham, Kenneth H. Wong
  • Patent number: 7019536
    Abstract: In one embodiment, a method of calibrating a multi-port vector network analyzer (VNA) includes (i) performing two-port calibrations on pairs of ports to determine forward and reverse systematic error terms associated with each pair of ports, wherein the pairs of ports are selected such that each port's systematic error terms (directivity, source match, reflection tracking, and load match) are determined, (ii) generating a switch error correction matrix using data from the two-port calibrations, and (iii) performing unknown thru calibration for at least one pair of ports that was not utilized in step (i), wherein the unknown thru calibration comprises applying the switch error correction matrix to measurement data and determining transmission tracking error terms using the corrected measurement data.
    Type: Grant
    Filed: January 3, 2005
    Date of Patent: March 28, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Keith F. Anderson, David V. Blackham, Brad R. Hokkanen, Kenneth H. Wong
  • Patent number: 7013229
    Abstract: Calibration is performed for the testing of a device under test. A first port of the device under test is connected to a port of a calibration module. A second port of the device under test is connected to a first port of a device tester. A third port of the device under test is connected to a second port of a device tester. The device tester performs measurements by the device tester to obtain calibration parameters. In response to commands from the device tester, the calibration module changes termination values at the port of the calibration module. The changing of the termination values is performed without physical disconnection of the port of the calibration module from the first port of the device under test.
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: March 14, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth H. Wong, James C. Liu, Johan J. Ericsson
  • Patent number: 7010443
    Abstract: Noise power is measured within one or more designated frequency bands of an applied signal. The measurement includes frequency translating the applied signal by a set of equally spaced frequencies to form a corresponding set of intermediate frequency signals, measuring the noise in at least two measurement bands of each of the intermediate frequency signals that are separated by the frequency spacing of the equally spaced frequencies, and determining the noise power in the designated frequency band of the applied signal based on the noise measurements.
    Type: Grant
    Filed: October 31, 2003
    Date of Patent: March 7, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Shigetsune Torin, Kenneth H. Wong, David VerNon Blackham
  • Patent number: 6995571
    Abstract: In one embodiment, a method comprises applying a stimulus signal to a reference frequency translation device (FTD) by a vector network analyzer during a calibration mode, wherein the reference FTD possesses equal conversion efficiency in forward and reverse directions and the reference FTD possesses unknown input and output reflection characteristics; measuring a response of the reference FTD; and determining forward and reverse transmission tracking error terms using data from the measured response and single-port error calibration terms.
    Type: Grant
    Filed: January 3, 2005
    Date of Patent: February 7, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: James C. Liu, Kenneth H. Wong, David V. Blackham
  • Patent number: 6965241
    Abstract: Testing is performed on a device under test. A first port of a first calibration module is connected to the device under test. A second port of the first calibration module is connected to a network analyzer. A first port of a second calibration module is connected to the device under test. A second port of the second calibration module is connected to the network analyzer. A measurement calibration and testing are performed without disconnecting the first port and the second port of the first calibration module and without disconnecting the first port and the second port of the second calibration module.
    Type: Grant
    Filed: October 7, 2003
    Date of Patent: November 15, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: James C. Liu, Kenneth H. Wong, Robert L. Shimon, Paul E. Cassanego, Srinivas M. Sundaram, Shigetsune Torin, Richard R. Hawkins