Patents by Inventor Kenneth Kupits

Kenneth Kupits has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9636088
    Abstract: A specimen collection or a specimen collection and testing device having an embossed or raised section. In one embodiment the device includes a first panel with one or more apertures for receiving specimen and a second panel having a removable tab, the removable tab aligned with the one or more apertures when the device is assembled such that depositing specimen through the one or more apertures deposits the specimen on the removable tab. A cover has one or more embossed (or raised) sections that align with the one or more apertures when the cover overlays the first panel, thus helping to prevent adherence of the specimen to the inner surface of the cover.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: May 2, 2017
    Assignee: IMMUNOSTICS, INC.
    Inventors: Vincent P. Lastella, Kenneth Kupits
  • Patent number: 8679420
    Abstract: A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including a test area aligned with the plurality of metering apertures, a spacer element disposed between the first panel and the sheet, wherein the metering aperture structure is spaced away from the test area thereby improving readability of the testing. A method of manufacturing a specimen testing device is also disclosed.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: March 25, 2014
    Assignee: Immunostics, Inc.
    Inventors: Vincent P. LaStella, Kenneth Kupits
  • Publication number: 20120003123
    Abstract: A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including a test area aligned with the plurality of metering apertures, a spacer element disposed between the first panel and the sheet, wherein the metering aperture structure is spaced away from the test area thereby improving readability of the testing. A method of manufacturing a specimen testing device is also disclosed.
    Type: Application
    Filed: August 25, 2008
    Publication date: January 5, 2012
    Inventors: Vincent P. LaStella, Kenneth Kupits
  • Publication number: 20100047129
    Abstract: A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including a test area aligned with the plurality of metering apertures, a spacer element disposed between the first panel and the sheet, wherein the metering aperture structure is spaced away from the test area thereby improving readability of the testing. A method of manufacturing a specimen testing device is also disclosed.
    Type: Application
    Filed: August 25, 2008
    Publication date: February 25, 2010
    Inventors: Vincent P. LaStella, Kenneth Kupits