Patents by Inventor Kenneth M. Skulina

Kenneth M. Skulina has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6521101
    Abstract: Beryllium-based multilayer structures and a process for fabricating beryllium-based multilayer mirrors, useful in the wavelength region greater than the beryllium K-edge (111 Å or 11.1 nm). The process includes alternating sputter deposition of beryllium and a metal, typically from the fifth row of the periodic table, such as niobium (Nb), molybdenum (Mo), ruthenium (Ru), and rhodium (Rh). The process includes not only the method of sputtering the materials, but the industrial hygiene controls for safe handling of beryllium. The mirrors made in accordance with the process may be utilized in soft x-ray and extreme-ultraviolet projection lithography, which requires mirrors of high reflectivity (>60%) for x-rays in the range of 60-140 Å (60-14.0 nm).
    Type: Grant
    Filed: December 9, 1996
    Date of Patent: February 18, 2003
    Assignee: The Regents of the University of California
    Inventors: Kenneth M. Skulina, Richard M. Bionta, Daniel M. Makowiecki, Craig S. Alford
  • Patent number: 5382342
    Abstract: A process for fabricating high efficiency x-ray lenses that operate in the 0.5-4.0 keV region suitable for use in biological imaging, surface science, and x-ray lithography of integrated circuits. The gradient index x-ray optics fabrication process broadly involves co-sputtering multi-layers of film on a wire, followed by slicing and mounting on block, and then ion beam thinning to a thickness determined by periodic testing for efficiency. The process enables the fabrication of transmissive gradient index x-ray optics for the 0.5-4.0 keV energy range. This process allows the fabrication of optical elements for the next generation of imaging and x-ray lithography instruments m the soft x-ray region.
    Type: Grant
    Filed: January 14, 1993
    Date of Patent: January 17, 1995
    Assignee: The United States of America as represented by the Department of Energy
    Inventors: Richard M. Bionta, Daniel M. Makowiecki, Kenneth M. Skulina