Patents by Inventor Kenneth W. Newman

Kenneth W. Newman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for statistical performance monitoring
    Patent number: 8000932
    Abstract: A method using statistical parameters (e.g. mean, standard deviation, exceptional values) of performance monitoring metrics to substantially reduce the quantity of performance monitoring data collected and reported, make system performance monitoring scalable and enhance the readability of the system performance display. The number of metrics monitored may be reduced by monitoring only one of any two metrics that are closely correlated.
    Type: Grant
    Filed: March 23, 2006
    Date of Patent: August 16, 2011
    Assignee: BMC Software, Inc.
    Inventors: Yiping Ding, Kenneth W. Newman
  • System and method for statistical performance monitoring
    Patent number: 7076397
    Abstract: A method using statistical parameters (e.g. mean, standard deviation, exceptional values) of performance monitoring metrics to substantially reduce the quantity of performance monitoring data collected and reported, make system performance monitoring scalable and enhance the readability of the system performance display. The number of metrics monitored may be reduced by monitoring only one of any two metrics that are closely correlated.
    Type: Grant
    Filed: October 10, 2003
    Date of Patent: July 11, 2006
    Assignee: BMC Software, Inc.
    Inventors: Yiping Ding, Kenneth W. Newman
  • System and method for statistical performance monitoring
    Publication number: 20040133395
    Abstract: A method using statistical parameters (e.g. mean, standard deviation, exceptional values) of performance monitoring metrics to substantially reduce the quantity of performance monitoring data collected and reported, make system performance monitoring scalable and enhance the readability of the system performance display. The number of metrics monitored may be reduced by monitoring only one of any two metrics that are closely correlated.
    Type: Application
    Filed: October 10, 2003
    Publication date: July 8, 2004
    Inventors: Yiping Ding, Kenneth W. Newman