Patents by Inventor Kentaro Harada
Kentaro Harada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11965319Abstract: A work machine includes a vehicle body and a work implement attached to the vehicle body. A system calibrates the work machine by using an external measurement apparatus. The system includes an attitude sensor, a positional sensor attached to the vehicle body, a storage device, an input device and a processor. The attitude sensor outputs attitude data indicative of an attitude of the vehicle body. The storage device stores machine data indicative of a position of the positional sensor in a vehicle body coordinate system. The input device receives an input of calibration data including a position of a predetermined measurement point on the work machine measured by the external measurement apparatus, and a position of the positional sensor measured by the external measurement apparatus. The processor calibrates the machine data based on the calibration data and the attitude data.Type: GrantFiled: February 17, 2020Date of Patent: April 23, 2024Assignee: KOMATSU LTD.Inventors: Junji Harada, Kentaro Takayama
-
Publication number: 20240102924Abstract: A diagnostic optical microscope according to the present embodiment includes at least one laser light source (11) configured to generate laser light for illuminating a sample (40) containing a light absorbing material, a lens configured to focus the laser light to be focused on the sample (40), scanning means for changing a focusing position of the laser light on the sample (40), and a light detector (31) configured to detect laser light transmitted through the sample (40) as signal light. A laser light intensity is changed to obtain a nonlinear region in which the laser light intensity and a signal light intensity have a nonlinear relation due to occurrence of saturation of absorption in the light absorbing material when the laser light intensity is maximized. An image is generated based on a nonlinear component of the signal light based on the saturation of absorption in the light absorbing material.Type: ApplicationFiled: January 19, 2022Publication date: March 28, 2024Inventors: Katsumasa FUJITA, Kentaro NISHIDA, Hikaru SATO, Hideo TANAKA, Yoshinori Harada
-
Publication number: 20230384401Abstract: A magnetic sensor is provided that can attenuate a magnetic field in a direction that is perpendicular to the magnetic field detecting direction at a higher rate than the magnetic field in the magnetic field detecting direction. Magnetic sensor 1 has: first soft magnetic layer 3; a pair of second soft magnetic layers 4A, 4B that is positioned at a location that is different from first soft magnetic layer 3 in the Z direction of first soft magnetic layer 3; and magnetic field detecting element 2 that is positioned between first soft magnetic layer 3 and second soft magnetic layers 4A, 4B in the Z direction, wherein magnetic field detecting element 2 has a magnetic field detecting direction that is parallel to a direction in which the pair of second soft magnetic layers 4A, 4B is arranged.Type: ApplicationFiled: July 31, 2023Publication date: November 30, 2023Inventors: Kentaro HARADA, Tsuyoshi UMEHARA, Kenichi TAKANO
-
Publication number: 20230350062Abstract: A position detection device includes a magnetic sensor and a first magnetic field generator. The first magnetic field generator is disposed to be spaced from and face the magnetic sensor in a first-axis direction, includes a first multipolar magnet, and generates a first magnetic field to be exerted on the magnetic sensor, the first multipolar magnet including N poles and S poles, the N and S poles being adjacent in the first-axis direction. The magnetic sensor and the first magnetic field generator are provided to be relatively movable with respect to each other in a second-axis direction orthogonal to the first-axis direction. A center position of the magnetic sensor in a third-axis direction orthogonal to both the first-axis direction and the second-axis direction is different from a center position of the first multipolar magnet in the third-axis direction.Type: ApplicationFiled: April 27, 2022Publication date: November 2, 2023Applicant: TDK CORPORATIONInventors: Yongfu CAI, Kentaro HARADA
-
Patent number: 11762044Abstract: A magnetic sensor is provided that can attenuate a magnetic field in a direction that is perpendicular to the magnetic field detecting direction at a higher rate than the magnetic field in the magnetic field detecting direction. Magnetic sensor 1 has: first soft magnetic layer 3; a pair of second soft magnetic layers 4A, 4B that is positioned at a location that is different from first soft magnetic layer 3 in the Z direction of first soft magnetic layer 3; and magnetic field detecting element 2 that is positioned between first soft magnetic layer 3 and second soft magnetic layers 4A, 4B in the Z direction, wherein magnetic field detecting element 2 has a magnetic field detecting direction that is parallel to a direction in which the pair of second soft magnetic layers 4A, 4B is arranged.Type: GrantFiled: June 29, 2022Date of Patent: September 19, 2023Assignee: TDK CorporationInventors: Kentaro Harada, Tsuyoshi Umehara, Kenichi Takano
-
Publication number: 20230280419Abstract: In a magnetic sensor, first and second resistors are provided in a path that connects a power supply port and a first output port, and third and fourth resistors are provided in a path that connects a ground port and the first output port. In a direction parallel to an X direction, both of a distance between the first resistor and the second resistor and a distance between the third resistor and the fourth resistor are ?/2, and a distance between the first resistor and the third resistor is zero. A magnetization of a magnetization pinned layer in the first and fourth resistors contains a component in a ?X direction. The magnetization of the magnetization pinned layer in the second and third resistors contains a component in the X direction.Type: ApplicationFiled: February 22, 2023Publication date: September 7, 2023Applicant: TDK CORPORATIONInventors: Tsuyoshi UMEHARA, Kentaro Harada, Yongfu Cai
-
Publication number: 20230176151Abstract: A method of designing a magnetic sensor that can easily accommodate various design conditions is provided. The method has: preparing magnetic sensors, wherein, for each magnetic sensor, magnetization directions of the first to fourth magnetically pinned layers form first to fourth angles ?1 to ?4 relative to a specific reference angle, respectively, and ?1=?3, ?2=?4, ?1??2, and each magnetic sensor has a value of ?1-?2 that is different from values of ?1-?2 of remaining magnetic sensors, for each magnetic sensor, obtaining a relationship between an angular range of the magnetization direction of the first to fourth magnetically free layers and an output range of the magnetic sensor, wherein the angular range satisfies a specific linear relationship between the magnetization direction and the output of the magnetic sensor, and selecting a magnetic sensor that satisfies required conditions for the angular range and the output range from among the magnetic sensors.Type: ApplicationFiled: January 31, 2023Publication date: June 8, 2023Inventors: Tsuyoshi UMEHARA, Kentaro HARADA, Takafumi KOBAYASHI
-
Patent number: 11598827Abstract: A method of designing a magnetic sensor that can easily accommodate various design conditions is provided. The method has: preparing magnetic sensors, wherein, for each magnetic sensor, magnetization directions of the first to fourth magnetically pinned layers form first to fourth angles ?1 to ?4 relative to a specific reference angle, respectively, and ?1=?3, ?2=?4, ?1??2, and each magnetic sensor has a value of ?1-?2 that is different from values of 01-02 of remaining magnetic sensors, for each magnetic sensor, obtaining a relationship between an angular range of the magnetization direction of the first to fourth magnetically free layers and an output range of the magnetic sensor, wherein the angular range satisfies a specific linear relationship between the magnetization direction and the output of the magnetic sensor, and selecting a magnetic sensor that satisfies required conditions for the angular range and the output range from among the magnetic sensors.Type: GrantFiled: December 7, 2021Date of Patent: March 7, 2023Assignee: TDK CorporationInventors: Tsuyoshi Umehara, Kentaro Harada, Takafumi Kobayashi
-
Patent number: 11580132Abstract: A cloud computing system, which works in cooperation with a plurality of relay devices, is configured to receive measurement data transmitted from each of the relay devices arranged in respective bases and perform accumulation processing in a hierarchical structure of a logical tree form in a measurement database, and perform aggregation analysis processing on the measurement data subjected to the accumulation processing in the respective bases and for each integration target between the bases. The aggregation analysis processing is performed on the measurement data for the each integration target between the bases by recognizing a relationship between the bases under the same starting point on the basis of a measurement unit of a measurement value or a type of a measurement source as for the value in the source accumulated in the database as an ending point of the hierarchical structure.Type: GrantFiled: February 26, 2018Date of Patent: February 14, 2023Assignee: Teclock SmartSolutionsCo., Ltd.Inventor: Kentaro Harada
-
Patent number: 11561079Abstract: Magnetic sensor assembly 1 has first member 10 having first to third magnetic sensors 13A to 13C, and second member 20 having first to third magnets 22A to 22C. Second member 20 can be moved in X and Y directions and can be rotated about a Z axis relative to first member 10. Output of first to third magnetic sensors 13A to 13C monotonously changes. A change of the output of first magnetic sensor and a change of the output of second magnetic sensor are different from each other. First to third magnets are positioned on first to third straight lines L1 to L3. A first angle that is formed between first straight line L1 and X axis, a second angle that is formed between second straight line L2 and X axis, and a third angle that is formed between third straight line L3 and Y axis are same.Type: GrantFiled: October 15, 2021Date of Patent: January 24, 2023Assignee: TDK CorporationInventors: Kentaro Harada, Tsuyoshi Umehara
-
Patent number: 11500357Abstract: A computing system is configured to analyze both measurement data and indicator data as big data aggregated in measurement database and indicator database by deep learning for each lot of a part or for each lot of a finished product and a part pre-associated with each other, and also for each consolidation target between bases subordinate to the same start point corresponding to identification information that specifies a business user of the computing system. Analysis target layers by the deep learning are a three-layer serial hierarchical structure containing a production condition layer and an environment condition layer as a start point for analysis of a part layer, or a four-layer serial hierarchical structure containing a part layer, a production condition layer, and an environment condition layer as a start point for analysis of a finished product layer.Type: GrantFiled: November 21, 2018Date of Patent: November 15, 2022Assignee: Teclock Smartsolutions Co., Ltd.Inventor: Kentaro Harada
-
Publication number: 20220334201Abstract: A magnetic sensor is provided that can attenuate a magnetic field in a direction that is perpendicular to the magnetic field detecting direction at a higher rate than the magnetic field in the magnetic field detecting direction. Magnetic sensor 1 has: first soft magnetic layer 3; a pair of second soft magnetic layers 4A, 4B that is positioned at a location that is different from first soft magnetic layer 3 in the Z direction of first soft magnetic layer 3; and magnetic field detecting element 2 that is positioned between first soft magnetic layer 3 and second soft magnetic layers 4A, 4B in the Z direction, wherein magnetic field detecting element 2 has a magnetic field detecting direction that is parallel to a direction in which the pair of second soft magnetic layers 4A, 4B is arranged.Type: ApplicationFiled: June 29, 2022Publication date: October 20, 2022Inventors: Kentaro HARADA, Tsuyoshi UMEHARA, Kenichi TAKANO
-
Patent number: 11408950Abstract: A magnetic sensor is provided that can attenuate a magnetic field in a direction that is perpendicular to the magnetic field detecting direction at a higher rate than the magnetic field in the magnetic field detecting direction. Magnetic sensor 1 has: first soft magnetic layer 3; a pair of second soft magnetic layers 4A, 4B that is positioned at a location that is different from first soft magnetic layer 3 in the Z direction of first soft magnetic layer 3; and magnetic field detecting element 2 that is positioned between first soft magnetic layer 3 and second soft magnetic layers 4A, 4B in the Z direction, wherein magnetic field detecting element 2 has a magnetic field detecting direction that is parallel to a direction in which the pair of second soft magnetic layers 4A, 4B is arranged.Type: GrantFiled: September 29, 2020Date of Patent: August 9, 2022Assignee: TDK CorporationInventors: Kentaro Harada, Tsuyoshi Umehara, Kenichi Takano
-
Publication number: 20220229124Abstract: A method of designing a magnetic sensor that can easily accommodate various design conditions is provided. The method has: preparing magnetic sensors, wherein, for each magnetic sensor, magnetization directions of the first to fourth magnetically pinned layers form first to fourth angles ?1 to ?4 relative to a specific reference angle, respectively, and ?1=?3, ?2=?4, ?1??2, and each magnetic sensor has a value of ?1-?2 that is different from values of 01-02 of remaining magnetic sensors, for each magnetic sensor, obtaining a relationship between an angular range of the magnetization direction of the first to fourth magnetically free layers and an output range of the magnetic sensor, wherein the angular range satisfies a specific linear relationship between the magnetization direction and the output of the magnetic sensor, and selecting a magnetic sensor that satisfies required conditions for the angular range and the output range from among the magnetic sensors.Type: ApplicationFiled: December 7, 2021Publication date: July 21, 2022Inventors: Tsuyoshi UMEHARA, Kentaro HARADA, Takafumi KOBAYASHI
-
Publication number: 20220128345Abstract: Magnetic sensor assembly 1 has first member 10 having first to third magnetic sensors 13A to 13C, and second member 20 having first to third magnets 22A to 22C. Second member 20 can be moved in X and Y directions and can be rotated about a Z axis relative to first member 10. Output of first to third magnetic sensors 13A to 13C monotonously changes. A change of the output of first magnetic sensor and a change of the output of second magnetic sensor are different from each other. First to third magnets are positioned on first to third straight lines L1 to L3. A first angle that is formed between first straight line L1 and X axis, a second angle that is formed between second straight line L2 and X axis, and a third angle that is formed between third straight line L3 and Y axis are same.Type: ApplicationFiled: October 15, 2021Publication date: April 28, 2022Inventors: Kentaro HARADA, Tsuyoshi UMEHARA
-
Publication number: 20210123992Abstract: A magnetic sensor is provided that can attenuate a magnetic field in a direction that is perpendicular to the magnetic field detecting direction at a higher rate than the magnetic field in the magnetic field detecting direction. Magnetic sensor 1 has: first soft magnetic layer 3; a pair of second soft magnetic layers 4A, 4B that is positioned at a location that is different from first soft magnetic layer 3 in the Z direction of first soft magnetic layer 3; and magnetic field detecting element 2 that is positioned between first soft magnetic layer 3 and second soft magnetic layers 4A, 4B in the Z direction, wherein magnetic field detecting element 2 has a magnetic field detecting direction that is parallel to a direction in which the pair of second soft magnetic layers 4A, 4B is arranged.Type: ApplicationFiled: September 29, 2020Publication date: April 29, 2021Inventors: Kentaro HARADA, Tsuyoshi UMEHARA, Kenichi TAKANO
-
Publication number: 20210105544Abstract: A screen of a measurement data input device includes a reference value display portion, a measurement data display portion in which a candidate of an actual measured value is displayed with a position of at least a least significant digit in a blank state, and a numerical value selection portion in which a numerical value at least corresponding to the least significant digit in a difference between a reference value and the actual measured value is displayed so as to be selectable and designatable from a numerical value display array. The input device displays a numerical value corresponding to addition of the numerical value at least corresponding to the least significant digit designated and the reference value in the digit position in the blank state in the measurement data display portion, and outputs all digits of the actual measured value.Type: ApplicationFiled: April 3, 2018Publication date: April 8, 2021Inventor: Kentaro HARADA
-
Patent number: 10943773Abstract: A ruthenium sputtering target, wherein a Si content is 10 to 100 wtppm, a total content of unavoidable impurities excluding gas components is 50 wtppm or less, and a remainder is Ru. By suppressing the crystal growth of ruthenium or a ruthenium alloy and reducing the generation of coarse crystal grains, arcing that occurs during sputtering is minimized, particle generation is reduced, and yield is improved.Type: GrantFiled: April 30, 2019Date of Patent: March 9, 2021Assignee: JX NIPPON MINING & METALS CORPORATIONInventor: Kentaro Harada
-
Publication number: 20200243204Abstract: A computing system is configured to analyze both measurement data and indicator data as big data aggregated in measurement database and indicator database by deep learning for each lot of a part or for each lot of a finished product and a part pre-associated with each other, and also for each consolidation target between bases subordinate to the same start point corresponding to identification information that specifies a business user of the computing system. Analysis target layers by the deep learning are a three-layer serial hierarchical structure containing a production condition layer and an environment condition layer as a start point for analysis of a part layer, or a four-layer serial hierarchical structure containing a part layer, a production condition layer, and an environment condition layer as a start point for analysis of a finished product layer.Type: ApplicationFiled: November 21, 2018Publication date: July 30, 2020Inventor: Kentaro HARADA
-
Publication number: 20190384773Abstract: To provide an innovative measurement solution service.Type: ApplicationFiled: February 26, 2018Publication date: December 19, 2019Inventor: Kentaro HARADA