Patents by Inventor Kevin Edward Docherty

Kevin Edward Docherty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Uses of electromagnetic interference patterns
    Patent number: 9618369
    Abstract: Various uses of visible light interference patterns are provided. Suitable interference patterns are those formed by diffraction from patterns of apertures. Typical uses disclosed herein relate to spatial metrology, such as a translational and/or angular position determination system. Further uses include the analysis of properties of the light itself (such as the determination of the wavelength of the electromagnetic radiation). Still further uses include the analysis of one or more properties (e.g. refractive index) of the matter through which the light passes. Part of the interference pattern is captured at a pixellated detector, such as a CCD chip, and the captured pattern compared with a calculated pattern. Very precise measurements of the spacing between maxima is possible, thus allowing very precise measurements of position of the detector in the interference pattern.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: April 11, 2017
    Assignee: THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
    Inventors: Jonathan Mark Ralph Weaver, Phillip Stephen Dobson, David Paul Burt, Stephen Thoms, Kevin Edward Docherty, Yuan Zhang
  • Uses of Electromagnetic Interference Patterns
    Publication number: 20110157599
    Abstract: Various uses of visible light interference patterns are provided. Suitable interference patterns are those formed by diffraction from patterns of apertures. Typical uses disclosed herein relate to spatial metrology, such as a translational and/or angular position determination system. Further uses include the analysis of properties of the light itself (such as the determination of the wavelength of the electromagnetic radiation). Still further uses include the analysis of one or more properties (e.g. refractive index) of the matter through which the light passes. Part of the interference pattern is captured at a pixellated detector, such as a CCD chip, and the captured pattern compared with a calculated pattern. Very precise measurements of the spacing between maxima is possible, thus allowing very precise measurements of position of the detector in the interference pattern.
    Type: Application
    Filed: August 25, 2009
    Publication date: June 30, 2011
    Applicant: THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
    Inventors: Jonathan Mark Ralph Weaver, Phillip Stephen Dobson, David Paul Burt, Stephen Thoms, Kevin Edward Docherty, Yuan Zhang