Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

Abstract: A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object.

Abstract: A method for inspecting an object includes emitting light from a light source, projecting the light emitted from the light source onto a surface of the object, splitting light reflected from the object surface into a first image and a second image, receiving the first image and the second image with an imaging sensor, and analyzing the first and second images received by the imaging sensor to facilitate inspecting at least a portion of the object.

Abstract: A method for extracting parameters of a cutting tool is provided. The method includes obtaining a measurement data set having a point cloud corresponding to a surface of the cutting tool and virtually slicing the point cloud at a pre-determined section to obtain a set of points on the pre-determined section. The method also includes generating a plurality of curves through the set of points and optimizing the plurality of curves to generate optimized fitting curves and extracting the parameters of the cutting tool from the optimized fitting curves. Furthermore, based on the presented rotary angle projection technique, a plurality of parameters can be extracted for the cutting tool.

Abstract: Infrared radiation detection systems and methods of making the same are provided. In one embodiment, the radiation detection system comprises: a housing having an open end exposed to a radiation emitting object; a detector positioned in the housing, the detector comprising a radiation sensing material for detecting infrared radiation, the radiation sensing material having a portion removed by etching or coated by a mask such that only a region of the radiation sensing material is capable of detecting the infrared radiation; and a lens positioned in the housing for transmitting infrared radiation from the object to the detector.

Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.

Abstract: A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.

Abstract: A computer-implemented method, system, and computer program code are provided for characterizing an edge break, e.g., part features and/or geometric discontinuities that could give rise to edge sharpness, as may be encountered in a chamfer, bevel, fillet and other part features. The methodology enables to accurately and consistently determine in a manufacturing setting, for example, any applicable geometric parameter for characterizing the edge break.

Abstract: A method for inspecting an object using a light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, dispersing light emitted from the light source into one of a diffraction pattern and an interference pattern, and imaging the patterned light onto the object using a lens.

Abstract: A projector (20) projects a structured light pattern (46) along a first optical axis (44) onto a surface (80). A viewer (50) attached to the projector (20) receives a reflection of the structured light pattern (46) from the surface (80) along a second optical axis (54), and digitizes a two-dimensional snapshot. The optical axes (44, 54) are non-parallel, and they meet within a common field of view of the projector (20) and the viewer (50). A computer (61) interfaced to the viewer (50) receives the digitized snapshot, and analyzes it to mathematically model the surface for display and inspection. The projector and attached viewer are designed as a hand-held unit with a hand grip (66) and a trigger button (68) to trigger a snapshot. A guide tip (70) on the unit extends beside the two optical axes (44, 54) to the common field of view to position the hand-held unit.

Abstract: An apparatus for controlling a machining system is provided. The apparatus include an optical unit configured to capture an image of an object based upon radiation generated from the object and an image processing unit configured to process the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object. The apparatus also includes a process model configured to establish target values for the parameters associated with the manufacture or repair of the object based upon process parameters for the machining system and a controller configured to control the process parameters for the machining system based upon the estimated and target values of the parameters associated with the manufacture or repair of the object.

Abstract: A phase shifting imaging module in a handheld imager is provided. The phase shifting imaging module includes a first beam splitter configured to split an image radiation beam into first and second image radiation beams. It also includes a first prism configured to align the first and second image radiation beams, and a second beam splitter configured to split the first and second image radiation beams into four image radiation beams. A second prism aligns the four image radiation beams. A phase mask introduces phase retardation between the four image radiation beams, resulting in four phase shifted image radiation beams. A pixilated sensor generates image data based upon each of the four phase shifted image radiation beams.

Abstract: A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.

Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

Abstract: A plurality of holographic recording media are positioned one above the other on an optical substrate and contain conventional stationary or moving imagery or data sets such as binary data representative of for example written text. A plurality of memory address access media are alternately interleaved between the plurality of holographic recording media. The memory access media causes a pair of optical beams to create an interference pattern at particular hologram recording media layers causing that layer to be read out. The specific memory access media layer is selected by means of scanning the interference pattern spatially within the interrogation beam, or by means of scanning the interrogation beam in wavelength.

Abstract: A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.

Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.

Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to be inspected, and generating an electronic mask based on the determined object profile. The electronic mask has an electronic opening having a profile defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.

Abstract: A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.

Abstract: A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining a profile of the object to be inspected, and generating a mask based on the determined profile, wherein the mask includes an opening extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.