Patents by Inventor Kevin Patrick Capaldo
Kevin Patrick Capaldo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7708446Abstract: Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.Type: GrantFiled: February 26, 2008Date of Patent: May 4, 2010Assignee: Sabic Innovative Plastic IP B.V.Inventors: Jian Zhou, Kevin Patrick Capaldo, Chung-hei Yeung, Mahari Tjahjadi, Andrei Sharygin
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Publication number: 20090219461Abstract: Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.Type: ApplicationFiled: February 26, 2008Publication date: September 3, 2009Inventors: Jian Zhou, Kevin Patrick Capaldo, Chung-hei Yeung, Mahari Tjahjadi, Andrei Sharygin
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Patent number: 7435986Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.Type: GrantFiled: December 12, 2006Date of Patent: October 14, 2008Assignee: Sabic Innovative Plastics IP B.V.Inventors: Kevin Patrick Capaldo, Mark Cheverton, Kevin George Harding, Robert Tait
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Patent number: 7371590Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.Type: GrantFiled: November 21, 2005Date of Patent: May 13, 2008Assignee: General Electric CompanyInventors: Kevin Patrick Capaldo, Mark Allen Cheverton, Dennis Joseph Coyle, Michael John Davis, Sameer Kirti Talsania, Masako Yamada, Chung-hei Yeung
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Patent number: 7341784Abstract: A light management film includes a first layer with a thermoplastic resin and a particular phosphonium sulfonate salt, and a second layer formed from a curable composition and having a refractive index of at least 1.5. The light management film exhibits reduced static electricity build-up and reduced dust attraction, making it easier to handle during fabrication of display devices such as the flat panel displays of laptop computers.Type: GrantFiled: September 10, 2004Date of Patent: March 11, 2008Assignee: General Electric CompanyInventors: Chunghei Yeung, Yu Hu, Kevin Patrick Capaldo, Anne Elizabeth Herrmann, Yan Zhang, Bret Chisholm, Paul Smigelski, Dennis Joseph Coyle
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Patent number: 7339664Abstract: A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects; reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects; directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects; and measuring a location of each of the examined defects in the light-management film.Type: GrantFiled: September 29, 2004Date of Patent: March 4, 2008Assignee: General Electric CompanyInventors: Kevin Patrick Capaldo, Yu Hu, Chunghei Yeung, Yan Zhang
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Patent number: 7251079Abstract: In one embodiment, a brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The brightness enhancement film is capable of collimating light, and wherein, without the coating, the diffusing film would be capable of spread light passing through the back surface. In another embodiment, the brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The diffusing film has a stress retardation gradient of less than or equal to 50 nm/in, wherein an interval for calculation of the stress retardation gradient is less than 1 inch. The brightness enhancement film is capable of collimating light.Type: GrantFiled: January 4, 2006Date of Patent: July 31, 2007Assignee: General Electric CompanyInventors: Kevin Patrick Capaldo, Brian Thomas Carvill, Dennis Joseph Coyle, Yu Hu, Chunghei Yeung, Yan Zhang
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Patent number: 7199386Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.Type: GrantFiled: July 29, 2004Date of Patent: April 3, 2007Assignee: General Electric CompanyInventors: Kevin Patrick Capaldo, Mark Cheverton, Kevin George Harding, Robert Tait