Patents by Inventor Kfir Dotan

Kfir Dotan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Adaptive geometry for optimal focused ion beam etching
    Patent number: 11315754
    Abstract: A method of evaluating a region of a sample that includes alternating layers of different material. The method includes milling, with a focused ion beam, a portion of the sample that includes the alternating layers of different material; reducing the milling area; and repeating the milling and reducing steps multiple times during the delayering process until the process is complete.
    Type: Grant
    Filed: April 27, 2020
    Date of Patent: April 26, 2022
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Ilya Blayvas, Gal Bruner, Yehuda Zur, Alexander Mairov, Ron Davidescu, Kfir Dotan, Alon Litman
  • ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
    Publication number: 20210335571
    Abstract: A method of evaluating a region of a sample that includes alternating layers of different material. The method includes milling, with a focused ion beam, a portion of the sample that includes the alternating layers of different material; reducing the milling area; and repeating the milling and reducing steps multiple times during the delayering process until the process is complete.
    Type: Application
    Filed: April 27, 2020
    Publication date: October 28, 2021
    Applicant: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Ilya Blayvas, Gal Bruner, Yehuda Zur, Alexander Mairov, Ron Davidescu, Kfir Dotan, Alon Litman