Patents by Inventor Kimani C. Toussaint, Jr.

Kimani C. Toussaint, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7599069
    Abstract: Provided are techniques for generating optical vector beams (e.g., radially and azimuthally polarized light) using passive or active phase stable optical interferometry. Techniques may split an input optical beam into at least two output beams, and then couple those beams simultaneously into a passively phase stable optical interferometer. Beam splitting may be achieved by a diffractive optical element and coupling may be achieved by a single refractive optical device (lenses) or by a single mirror device (e.g., parabolic and spherical). The interferometer may provide the ability to manipulate (or transform) the polarization of part of the wavefront of each beam, as well as the ability to manipulate (or transform) the phase of part of the wavefront of each beam, such that the beams when combined have a vector beam polarization state.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: October 6, 2009
    Assignee: The University of Chicago
    Inventors: Kimani C. Toussaint, Jr., Norbert F. Scherer, Justin E. Jureller, Sungnam Park
  • Patent number: 6822739
    Abstract: A system for obtaining ellipsometric data from a sample. The system includes a source for providing a monochromatic light beam. The system also includes a nonlinear crystal for converting the monochromatic light beam into photon pairs by disintegrating photons from the monochromatic light beam, such that each of the photon pairs exhibits entanglement properties, wherein one of the photons of the pair is directed to the sample and the other of the photons of the pair is not directed to the sample. The system further includes a circuit for calculating the coincidence of one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair, wherein the measurements of the sample are obtained by analyzing the coincidence and the entanglement properties between one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: November 23, 2004
    Assignee: Trustees of Boston University
    Inventors: Alexander V. Sergienko, Bahaa E. A. Saleh, Malvin C. Teich, Kimani C. Toussaint, Jr., Ayman F. Abouraddy