Abstract: In one embodiment, a beam detector includes a first aperture plate including a first passage hole, a second aperture plate including a second passage hole that allows a single detection target beam passing through the first passage hole to pass therethrough, and a sensor detecting a beam current of the detection target beam passing through the second passage hole. The second aperture plate includes an electrically conductive material, a plurality of third passage holes are formed around the second passage hole, and the plurality of third passage holes allow light to pass therethrough.

Abstract: According to one embodiment, a beam detector includes a first aperture substrate including a first passage hole smaller than a pitch between beams of a multi charged particle beam, a second aperture substrate including a second passage hole allowing one detection target beam which has passed through the first passage hole, and a sensor detecting a beam current of the detection target beam which has passed through the second passage hole. The second aperture substrate has light permeability, and includes a conductive material.

Abstract: A semiconductor device includes a clock terminal to and from which a clock is allowed to be input and output, and a data terminal to and from which data is allowed to be input and output. In the semiconductor device, the data synchronized with the clock that is input to the clock terminal or is output from the clock terminal is output from the data terminal, and when the clock is output from the clock terminal, the clock is output irrespective of whether or not data transfer of the data is being executed.

Abstract: A semiconductor integrated circuit device includes a control unit configured to control a switching element or an output transistor of a power supply device, a monitor terminal for monitoring an output voltage of the power supply device, a test unit configured to output a test signal to the monitor terminal before activation of the power supply device, and a determination unit configured to determine whether or not the monitor terminal is open, on the basis of a voltage of the monitor terminal when the test unit outputs the test signal to the monitor terminal.

Abstract: A voltage monitoring circuit for monitoring an output voltage of a power supply device. The power supply device includes a voltage conversion part that converts an input voltage to the output voltage according to a difference between a feedback voltage based on the output voltage and a first reference voltage. The voltage monitoring circuit includes: a threshold voltage generation circuit configured to generate a threshold voltage from the first reference voltage; and a comparator configured to compare the threshold voltage with the feedback voltage.

Abstract: A semiconductor device includes a clock terminal to and from which a clock is allowed to be input and output, and a data terminal to and from which data is allowed to be input and output. In the semiconductor device, the data synchronized with the clock that is input to the clock terminal or is output from the clock terminal is output from the data terminal, and when the clock is output from the clock terminal, the clock is output irrespective of whether or not data transfer of the data is being executed.

Abstract: A semiconductor integrated circuit device includes a control unit configured to control a switching element or an output transistor of a power supply device, a monitor terminal for monitoring an output voltage of the power supply device, a test unit configured to output a test signal to the monitor terminal before activation of the power supply device, and a determination unit configured to determine whether or not the monitor terminal is open, on the basis of a voltage of the monitor terminal when the test unit outputs the test signal to the monitor terminal.

Abstract: A voltage monitoring circuit for monitoring an output voltage of a power supply device. The power supply device includes a voltage conversion part that converts an input voltage to the output voltage according to a difference between a feedback voltage based on the output voltage and a first reference voltage. The voltage monitoring circuit includes: a threshold voltage generation circuit configured to generate a threshold voltage from the first reference voltage; and a comparator configured to compare the threshold voltage with the feedback voltage.

Abstract: A power supply circuit 1 includes an output circuit that generates an output voltage by performing a power supply operation based on an input voltage, an output terminal to which, after start-up of the power supply operation, the output voltage is applied, and a control circuit that causes a test current to flow between the output terminal and a ground. The control circuit detects, as a test voltage, a voltage at the output terminal in a test period in which the test current is caused to flow. When the test voltage at a predetermined judgment timing is lower than a judgment voltage, the control circuit judges that an output capacitor is connected and thus enables the power supply operation.

Abstract: A soft start circuit accepts an input of a reference voltage set arbitrarily, and generates a soft start voltage that takes a predetermined sweep time to slowly rise from a predetermined lowest value to a highest value that is higher than the reference voltage and changes in accordance with the reference voltage.

Abstract: A soft start circuit accepts an input of a reference voltage set arbitrarily, and generates a soft start voltage that takes a predetermined sweep time to slowly rise from a predetermined lowest value to a highest value that is higher than the reference voltage and changes in accordance with the reference voltage.

Abstract: A power supply circuit 1 includes an output circuit that generates an output voltage by performing a power supply operation based on an input voltage, an output terminal to which, after start-up of the power supply operation, the output voltage is applied, and a control circuit that causes a test current to flow between the output terminal and a ground. The control circuit detects, as a test voltage, a voltage at the output terminal in a test period in which the test current is caused to flow. When the test voltage at a predetermined judgment timing is lower than a judgment voltage, the control circuit judges that an output capacitor is connected and thus enables the power supply operation.

Abstract: A switching power supply device has a reference voltage generator for generating a reference voltage, a ripple injector for generating a ripple by use of a pulse voltage indicating the on/off state of a switching element and injecting the ripple into the reference voltage, an integrated voltage generator for generating an integrated voltage commensurate with the integrated value of the pulse voltage throughout its on/off-duty periods, a subtractor for lowering according to the integrated voltage the reference voltage before injection of the ripple or the supply voltage to a buffer that feeds the ripple injector with the pulse voltage after making its pulse height constant, a comparator for comparing a feedback voltage with the reference voltage after injection of the ripple, and a switching controller for generating an output voltage from an input voltage by non-linear control by turning on/off the switching element according to the output of the comparator.

Abstract: A cooling fan includes: a hub; a plurality of cooling vanes provided along an outer circumference of the hub; and an annular connector for connecting the cooling vanes. The hub is provided with a through hole that axially penetrates the hub. A first cover on a case for covering an outward side of the cooling fan is provided with a first outer-air intake. A second cover for partitioning between the cooling fan and a crankcase and for covering an inward side of the cooling fan is provided with a second outer-air intake. With this arrangement, even when one outer-air intake (for instance, the first outer-air intake) adjacent to where the cooling vanes are provided is clogged by a large amount of dust generated during operations, the cooling vanes can breathe from the non-clogged other outer-air intake (for instance, the second outer-air intake) through the through hole, thereby restraining reduction in air flow.

Abstract: A switching power supply device has a reference voltage generator for generating a reference voltage, a ripple injector for generating a ripple component by use of a pulse voltage indicating the on/off state of a switching element and injecting the ripple component into the reference voltage, an integrated voltage generator for generating an integrated voltage commensurate with the integrated value of the pulse voltage throughout its on- and off-duty periods, a subtractor for lowering according to the integrated voltage the reference voltage before injection of the ripple component or the supply voltage to a buffer that feeds the ripple injector with the pulse voltage after making its pulse height constant, a comparator for comparing a feedback voltage with the reference voltage after injection of the ripple component, and a switching controller for generating an output voltage from an input voltage by non-linear control by turning on and off the switching element according to the output signal of the compara

Abstract: A cooling fan includes: a hub; a plurality of cooling vanes provided along an outer circumference of the hub; and an annular connector for connecting the cooling vanes. The hub is provided with a through hole that axially penetrates the hub. A first cover on a case for covering an outward side of the cooling fan is provided with a first outer-air intake. A second cover for partitioning between the cooling fan and a crankcase and for covering an inward side of the cooling fan is provided with a second outer-air intake. With this arrangement, even when one outer-air intake (for instance, the first outer-air intake) adjacent to where the cooling vanes are provided is clogged by a large amount of dust generated during operations, the cooling vanes can breathe from the non-clogged other outer-air intake (for instance, the second outer-air intake) through the through hole, thereby restraining reduction in air flow.