Patents by Inventor Kirby Garyen Hong

Kirby Garyen Hong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for use in calibrating a VNA
    Patent number: 7054776
    Abstract: A method and apparatus are used to calibration a Vector Network Analyzer (VNA). The method includes providing a calibration module with a single port, providing within the calibration module a set of reflecting components with known scattering parameters, providing control signals to the calibration module through the single port, providing the known scattering parameters to the VNA through the single port, coupling one of reflecting components to the VNA, measuring scattering parameters, and comparing the measured scattering parameters with the known scattering parameters. The apparatus includes a calibration module and a controller module. In one embodiment, the calibration module includes a set of reflecting components, a memory that stores the characterization data, and a current source which sends characterization data in the form of current pulses to the controller module. The controller module includes a voltage source that generates the control signals used by the calibration module.
    Type: Grant
    Filed: May 11, 2005
    Date of Patent: May 30, 2006
    Assignee: Anritsu Company
    Inventors: Donald Anthony Bradley, Kirby Garyen Hong
  • Single port single connection VNA calibration apparatus
    Patent number: 6917892
    Abstract: A method and apparatus are used to calibration a Vector Network Analyzer (VNA). The method includes providing a calibration module with a single port, providing within the calibration module a set of reflecting components with known scattering parameters, providing control signals to the calibration module through the single port, providing the known scattering parameters to the VNA through the single port, coupling one of reflecting components to the VNA, measuring scattering parameters, and comparing the measured scattering parameters with the known scattering parameters. The apparatus includes a calibration module and a controller module. In one embodiment, the calibration module includes a set of reflecting components, a memory that stores the characterization data, and a current source which sends characterization data in the form of current pulses to the controller module. The controller module includes a voltage source that generates the control signals used by the calibration module.
    Type: Grant
    Filed: September 16, 2002
    Date of Patent: July 12, 2005
    Assignee: Anritsu Company
    Inventors: Donald Anthony Bradley, Kirby Garyen Hong
  • Single port single connection VNA calibration apparatus
    Publication number: 20040054490
    Abstract: A method and apparatus are used to calibration a Vector Network Analyzer (VNA). The method includes providing a calibration module with a single port, providing within the calibration module a set of reflecting components with known scattering parameters, providing control signals to the calibration module through the single port, providing the known scattering parameters to the VNA through the single port, coupling one of reflecting components to the VNA, measuring scattering parameters, and comparing the measured scattering parameters with the known scattering parameters. The apparatus includes a calibration module and a controller module. In one embodiment, the calibration module includes a set of reflecting components, a memory that stores the characterization data, and a current source which sends characterization data in the form of current pulses to the controller module. The controller module includes a voltage source that generates the control signals used by the calibration module.
    Type: Application
    Filed: September 16, 2002
    Publication date: March 18, 2004
    Inventors: Donald Anthony Bradley, Kirby Garyen Hong