Patents by Inventor Kiryel Ko

Kiryel Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing image sensor using frequency domain, test system performing the same and method of manufacturing image sensor using the same
    Patent number: 11729523
    Abstract: In a method of testing an image sensor, at least one test image is captured using the image sensor that is a device under test (DUT). A composite image is generated based on the at least one test image. A plurality of frequency data are generated by performing frequency signal processing on the composite image. It is determined whether the image sensor is defective by analyzing the plurality of frequency data.
    Type: Grant
    Filed: August 30, 2021
    Date of Patent: August 15, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jongbae Lee, Kiryel Ko, Jinmyoung An
  • METHOD OF TESTING IMAGE SENSOR USING FREQUENCY DOMAIN, TEST SYSTEM PERFORMING THE SAME AND METHOD OF MANUFACTURING IMAGE SENSOR USING THE SAME
    Publication number: 20220114755
    Abstract: In a method of testing an image sensor, at least one test image is captured using the image sensor that is a device under test (DUT). A composite image is generated based on the at least one test image. A plurality of frequency data are generated by performing frequency signal processing on the composite image. It is determined whether the image sensor is defective by analyzing the plurality of frequency data.
    Type: Application
    Filed: August 30, 2021
    Publication date: April 14, 2022
    Inventors: Jongbae Lee, Kiryel Ko, Jinmyoung An