Patents by Inventor Kiyotake HORIE

Kiyotake HORIE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11113543
    Abstract: A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.
    Type: Grant
    Filed: December 1, 2017
    Date of Patent: September 7, 2021
    Assignee: HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
    Inventors: Nobuhiro Chihara, Masahiko Honda, Toshihide Kishi, Masashi Shinbo, Kiyotake Horie
  • Patent number: 11080535
    Abstract: A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.
    Type: Grant
    Filed: December 1, 2017
    Date of Patent: August 3, 2021
    Assignee: HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
    Inventors: Nobuhiro Chihara, Masahiko Honda, Toshihide Kishi, Masashi Shinbo, Kiyotake Horie
  • Publication number: 20190392225
    Abstract: A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.
    Type: Application
    Filed: December 1, 2017
    Publication date: December 26, 2019
    Applicant: HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
    Inventors: Nobuhiro CHIHARA, Masahiko HONDA, Toshihide KISHI, Masashi SHINBO, Kiyotake HORIE