Patents by Inventor Klaus Standner

Klaus Standner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card and method for producing a probe card
    Patent number: 10184978
    Abstract: A probe card for a wafer tester includes a mother card having a reinforcing element and at least one daughter card which is rigidly connected to the reinforcing element detachably. The mother card includes electrical contacts for producing an electrical connection with the wafer tester. The at least one daughter card includes electrical contact elements for making contact with an electrical circuit on a wafer. In addition, the mother card and the at least one daughter card are electrically detachably connected to one another via an electrical interface.
    Type: Grant
    Filed: December 16, 2014
    Date of Patent: January 22, 2019
    Assignee: Infineon Technologies AG
    Inventors: Karl Dominizi, Oliver Frank, Klaus Standner, Stefan Zielke
  • PROBE CARD AND METHOD FOR PRODUCING A PROBE CARD
    Publication number: 20150168456
    Abstract: A probe card for a wafer tester includes a mother card having a reinforcing element and at least one daughter card which is rigidly connected to the reinforcing element detachably. The mother card includes electrical contacts for producing an electrical connection with the wafer tester. The at least one daughter card includes electrical contact elements for making contact with an electrical circuit on a wafer. In addition, the mother card and the at least one daughter card are electrically detachably connected to one another via an electrical interface.
    Type: Application
    Filed: December 16, 2014
    Publication date: June 18, 2015
    Inventors: Karl Dominizi, Oliver Frank, Klaus Standner, Stefan Zielke
  • Test apparatus with low-reflection signal distribution
    Patent number: 7355414
    Abstract: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: April 8, 2008
    Assignee: Infineon Technologies, AG
    Inventors: Ralf Arnold, Heinz Mattes, Klaus Standner
  • Test apparatus with low-reflection signal distribution
    Publication number: 20060186896
    Abstract: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.
    Type: Application
    Filed: February 7, 2006
    Publication date: August 24, 2006
    Inventors: Ralf Arnold, Heinz Mattes, Klaus Standner