Abstract: A circuit arrangement is provided comprising a first partial circuit to receive a supply voltage, a second partial circuit to receive an output signal of the first partial circuit and a first clock signal, the second partial circuit to store the output signal of the first partial circuit depending on the first clock signal, and a control unit to decouple the supply voltage from the first partial circuit for a time period that is shorter than a cycle duration of the first clock signal, wherein the control unit is configured to receive a second clock signal which is derived from the first clock signal by delaying.

Abstract: Method for ascertaining an operating range for an integrated circuit which has a plurality of system components, in which a test routine is performed for testing at least one system component from the plurality of system components, where the at least one system component is not in operation and at least one other untested system component from the plurality of system components is ready for operation when the at least one system component is tested.

Abstract: One embodiment of the invention provides a circuit. The circuit includes a switching unit configured to connect or disconnect a voltage domain to a supply voltage input. The switching unit includes a first switch, a second switch and a third switch. The circuit includes a control signal input configured to receive a switch control signal. The circuit includes a signal distribution unit that is configured to output the switch control signal to the first switch delayed by a first time interval and to output the switch control signal to the second switch and to the third switch delayed by a second time interval.

Abstract: A method of switching a power supply of at least one voltage domain of a semiconductor circuit uses at least one microswitch, which is designed in standard cell design, to switch the power supply, so that the standard cell design method can be automated. Multiple microswitches can be disposed, evenly distributed, over those areas of the semiconductor circuit in which there is a voltage domain of which the power supply is to be switched. The microswitches of a voltage domain are defined by being switched by the same control signal. A semiconductor circuit to switch the power supply of the voltage domain includes microswitches, which can be constructed as transistors.

Abstract: Implementations are presented herein that relate to a circuit arrangement and a method of operating a circuit arrangement.

Abstract: Method for ascertaining an operating range for an integrated circuit which has a plurality of system components, in which a test routine is performed for testing at least one system component from the plurality of system components, where the at least one system component is not in operation and at least one other untested system component from the plurality of system components is ready for operation when the at least one system component is tested.

Abstract: One embodiment of the invention provides a circuit. The circuit includes a switching unit configured to connect or disconnect a voltage domain to a supply voltage input. The switching unit includes a first switch, a second switch and a third switch. The circuit includes a control signal input configured to receive a switch control signal. The circuit includes a signal distribution unit that is configured to output the switch control signal to the first switch delayed by a first time interval and to output the switch control signal to the second switch and to the third switch delayed by a second time interval.

Abstract: A method of switching a power supply of at least one voltage domain of a semiconductor circuit uses at least one microswitch, which is designed in standard cell design, to switch the power supply, so that the standard cell design method can be automated. Multiple microswitches can be disposed, evenly distributed, over those areas of the semiconductor circuit in which there is a voltage domain of which the power supply is to be switched. The microswitches of a voltage domain are defined by being switched by the same control signal. A semiconductor circuit to switch the power supply of the voltage domain includes microswitches, which can be constructed as transistors.