Abstract: An optical device 1 includes: an optical element block 10 including optical elements that form an optical path P of light used for optical measurement, arranged around a measurement subject S so that the optical path P intersects the measurement subject S; and a rotation mechanism 20 configured to change an angle of the optical element block 10 relative to the measurement subject S so that the total length of the portion of the optical path P coincident with the measurement subject S changes.

Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

Abstract: A measuring device 1 according to the present disclosure measures a state of a solution L. The measuring device 1 includes a measuring unit 10 that outputs a measurement signal associated with the state of the solution L, a protection unit 20 attached to the measuring unit 10, and a controller 40 that obtains the information on the state of the solution L on the basis of a measurement signal output from the measuring unit 10. The measuring unit 10 has a first part P1 in a usable state that contributes to output of the measurement signal by coming into contact with the solution L, and a second part that is isolated from the solution L by the protection unit 20 and is in a standby state for measurement.

Abstract: A calibration device generates a data set of a reference sample including spectral data of the reference sample containing a plurality of components and each objective variable determined by a content of each of the components of the reference sample, and trains, by machine learning using the data set of the reference sample, a machine learning model that outputs at least one objective variable among the objective variables of each of the components in response to input of the spectral data.

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

Abstract: A permeation estimation apparatus includes an interface configured to connect to a sensor that measures a concentration of a component, of a soaked material, that is eluted in a soaking solution in which the soaked material is soaking, and a controller configured to acquire the concentration of the component from the interface and estimate the degree of permeation of the soaking solution with respect to the soaked material based on the measurement result of the concentration of the component.

Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

Abstract: A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

Abstract: A measuring device 1 according to the present disclosure measures a state of a solution L. The measuring device 1 includes a measuring unit 10 that outputs a measurement signal associated with the state of the solution L, a protection unit 20 attached to the measuring unit 10, and a controller 40 that obtains the information on the state of the solution L on the basis of a measurement signal output from the measuring unit 10. The measuring unit 10 has a first part P1 in a usable state that contributes to output of the measurement signal by coming into contact with the solution L, and a second part that is isolated from the solution L by the protection unit 20 and is in a standby state for measurement.

Abstract: A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction ar

Abstract: A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

Abstract: A spectroscopic analysis device includes: a light source configured to emit light for irradiating a specimen; a prism stuck to the specimen and configured to totally reflect the light emitted from the light source; a polarizing separation element configured to separate the light totally reflected by the prism into a first and second polarized light components that are orthogonal to each other; a wavelength dispersing element configured to disperse respective wavelength components of the first and second polarized light components that are separated by the polarizing separation element; an image capturing element configured to capture respective images of the first and second polarized light components that are dispersed by the wavelength dispersing element; and a processing unit configured to perform component analysis on the specimen by obtaining an absorbency at each wavelength by using an imaging signal output from the image capturing element.

Abstract: An optical analysis system 1 according to the present disclosure includes: an irradiator 11 that, in a chemical reaction system 30 for obtaining a product AB by synthesizing a first raw material A and a second raw material B, irradiates each of the first raw material A and the second raw material B prior to initiation of synthesis with irradiation light L1 and irradiates a mixture C after initiation of the synthesis with irradiation light L1; a detector 12 that detects measuring light L2 including information regarding an optical spectrum of each of the first raw material A, the second raw material B, and the mixture C; and an arithmetic unit 22 that calculates the optical spectrum of each of the first raw material A, the second raw material B, and the mixture C and calculates an optical spectrum of the product AB.

Abstract: A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction ar

Abstract: A spectroscopic analysis device includes: a light source configured to emit light for irradiating a specimen; a prism stuck to the specimen and configured to totally reflect the light emitted from the light source; a polarizing separation element configured to separate the light totally reflected by the prism into a first and second polarized light components that are orthogonal to each other; a wavelength dispersing element configured to disperse respective wavelength components of the first and second polarized light components that are separated by the polarizing separation element; an image capturing element configured to capture respective images of the first and second polarized light components that are dispersed by the wavelength dispersing element; and a processing unit configured to perform component analysis on the specimen by obtaining an absorbency at each wavelength by using an imaging signal output from the image capturing element.

Abstract: A polarization inspector for inspecting an inspection target, the polarization inspector having a polarization divider for spatially dividing at least a reflected beam of light from the inspection target by irradiating an illumination beam into divided beams of lights mutually different in polarization direction; one or more optical receivers for receiving the divided beams of lights and generating an image signal based on the divided beams of lights; and a processor for calculating at least one of an elliptical azimuth angle, a polarization degree and a polarization component intensity from the image signal.

Abstract: A polarization inspector for inspecting an inspection target, the polarization inspector having a polarization divider for spatially dividing at least a reflected beam of light from the inspection target by irradiating an illumination beam into divided beams of lights mutually different in polarization direction; one or more optical receivers for receiving the divided beams of lights and generating an image signal based on the divided beams of lights; and a processor for calculating at least one of an elliptical azimuth angle, a polarization degree and a polarization component intensity from the image signal.