Abstract: A head-up display includes an image generation unit emitting light for generating a predetermined image and a mirror reflecting the light so that a transmission member is irradiated with the light emitted by the image generation unit. The image generation unit includes a light source, an optical member transmitting light from the light source, and a liquid crystal portion in which an original image for forming the predetermined image is generated by the light emitted from the optical member. The original image is formed in a shape corresponding to distortion of the predetermined image. The optical member is formed in a shape matching the shape of the original image.

Abstract: An image projector is provided for which assembly work and optical axis adjustment are easy while visibility at both sides of an image is secured. This image projector includes a lighting substrate (25), a lens part (23) that adjusts an optical axis of emitted light from light-emitting elements (25a), and an image display part (22) which displays an image on a display surface and through which the emitted light is transmitted. The display surface of the image display part (22) has a central region (22a) and side regions (22b) located on both sides. In the lens part (23), a first lens region (23b) corresponding to the central region (22a) and second lens regions (23c) corresponding to the side regions (22b) are integrally formed. Radiation directions of light having passed through the second lens regions (23c) are more inclined toward laterally outer sides than a radiation direction of light having passed through the first lens region (23b).

Abstract: An image generation device for generating an image for a head-up display includes: a first light source; a second light source disposed to be spaced apart from the first light source by a certain distance; a lens that transmits light emitted from the first light source and the second light source; and a display device that forms light that generates the image from the light transmitted through the lens. The lens is constituted by a first region that transmits first light from the first light source, and a second region that transmits second light from the second light source, and a light shield is further provided to prevent the first light from transmitting through the second region and prevent the second light from transmitting through the first region.

Abstract: This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.

Abstract: A three-dimensional quadrupole mass spectrometer is suitable for preventing occurrence of a situation where the mass spectrometry cannot be conducted by an excessive existence of ions in a three-dimensional ion confining space, an amount of ions emitted from an ion source 1 is detected by a first electrode 3 of a lens, an output signal therefrom is inputted to a power supply 17 of a second electrode 4 of the lens and a focusing condition of ions caused by the lens is changed such that an amount of ions existing in the three-dimensional ion confining space does not exceed a certain level.

Abstract: This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.

Abstract: ObjectTo improve detecting sensitivity of negative ions.ConstructionA mass-filtered negative ion beam 22 is irradiated on a plate 24 after passing through a slit to emit neutral atoms 27, the neutral atoms 27 being ionized by an electron flow 33 after passing through a mesh electrode 30, the ion beam 35 ionized entering to a secondary electron multiplier to be amplified, then the amplified current entering to an amplifier 37 to be further amplified.EffectsThe detecting sensitivity can be improved more than ten times owing to the difference in existing amount of sputtering yield between neutral atoms and secondary ions.