Abstract: A high-strength aluminum alloy clad material for heat exchangers which excels in corrosion resistance and formability before brazing and has improved strength after brazing. The aluminum alloy clad material is made up of a core material and a brazing material, with one or both sides of the core material clad with the brazing material. The core material is made up of an aluminum alloy containing from 0.3% to less than 0.6% of Mn, from more than 0.6% to 1.0% of Cu, less than 0.1% of Si, 0.3% or less of Fe, and from 0.06% to 0.35% of Ti, with the remainder being Al and impurities; and the brazing material used to clad the core material is made up of an Al—Si aluminum alloy in which the Ca content is limited to 0.006% or less.

Abstract: A junction leakage current compensating circuit for a semiconductor memory device of a charge-storage type in which information can be erased by strong ultraviolet light is disclosed. The device comprises at least one dummy bit line connected to dummy cells incorporated with main memory cells and at least one compensating circuit for detecting the potential of the dummy bit line. The compensating circuit supplies compensating currents to bit lines connected to the main memory cells, responsive to the change of the potential of the dummy bit line.

Abstract: A voltage detection circuit, for detecting two voltages, that is, a high voltage level and a low voltage level, is disclosed. The voltage detection circuit according to the present invention includes a load element group having a first terminal and a second terminal, and a transistor which is connected between the second terminal of the load element group and ground. The sum of threshold voltages of the load element group has a value higher than the low voltage level to be detected and lower than the high voltage level to be detected. The load element group is kept in an off state when the low voltage level is applied thereto and is kept in on state when the high voltage level is applied thereto.

Abstract: A method and means for measuring the electric properties of capacitor, inductor and resistor elements is described. The element to be measured and a reference element are connected in series, and standard A.C. voltage is applied to one end of the series circuit whereas a variable voltage is applied to the other end of said circuit. The variable voltage is controlled in order to zero the voltage or the current at the common junction of both the element to be measured and the reference element. Said standard voltage and said variable voltage are rectified, and the generated D.C. signals are used for charging integrator capacitors. These capacitors are then discharged and the ratio of charging and discharging time is a measure of the resistance, capacitance and inductance, respectively, of the unknown element. Dielectric and magnetic dissipation factors may be measured in a similar manner.