Patents by Inventor Koichi Murata
Koichi Murata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11948976Abstract: A vertical metal oxide semiconductor field effect transistor, including a starting substrate of a first conductivity type, a second first-conductivity-type epitaxial layer provided on a first surface of the starting substrate via a first first-conductivity-type epitaxial layer, a first semiconductor region of the first conductivity type provided as a portion of the second first-conductivity-type epitaxial layer, a second-conductivity-type epitaxial layer forming a pn junction interface with the second first-conductivity-type epitaxial layer and supplying a minority carrier to the second first-conductivity-type epitaxial layer, a plurality of second semiconductor regions of the first conductivity type selectively provided in the second-conductivity-type epitaxial layer, a plurality of trenches penetrating through the second semiconductor regions and the second-conductivity-type epitaxial layer, and a plurality of gate electrodes provided in the trenches via gate insulating films.Type: GrantFiled: October 29, 2021Date of Patent: April 2, 2024Assignee: FUJI ELECTRIC CO., LTD.Inventors: Takeshi Tawara, Hidekazu Tsuchida, Koichi Murata
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Patent number: 11906569Abstract: A semiconductor wafer evaluation apparatus brings a contact maker (mercury liquefied at room temperature), as a Schottky electrode, into contact with a semiconductor wafer, intermittently applies a voltage from a pulse power supply, and evaluates the state (kinds, density) of point defects by an evaluation means based on the status of the electrostatic capacity of the semiconductor wafer. In this manner, the state (kinds, density) of the point defects in the plane of a large-diameter semiconductor wafer is directly evaluated using a large table.Type: GrantFiled: November 5, 2021Date of Patent: February 20, 2024Assignee: SHOWA DENKO K.K.Inventors: Koichi Murata, Isaho Kamata, Hidekazu Tsuchida, Akira Miyasaka
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Publication number: 20230377452Abstract: The trigger signal includes a first group of pulses—indicating start timing and a second group of pulses indicating end timing of data processing. The data processing apparatus processes measurement data sets measured during a period between the start timing and the end timing by temporally align the measurement data sets with each other. Each of the first group of pulses and the second group of pulses includes a first pulse and a second pulse different in pulse width from each other. The start timing is timing distant by a first time period from the first pulse or timing distant by a second time period from the second pulse in the first group of pulses, and the end timing is timing distant by the first time period from the first pulse or timing distant by the second time period from the second pulse in the second group of pulses.Type: ApplicationFiled: October 15, 2021Publication date: November 23, 2023Inventor: Koichi MURATA
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Publication number: 20230368408Abstract: A position estimator outputs, by inputting information obtained from the frame images into a trained model, positional information of a plurality of parts of a human body from the trained model. A determination processor outputs information on erroneous detection by the position estimator. The position estimator outputs a first position group in response to an input of an obtained first frame image, the first frame image being obtained by the receiver and outputs a second position group in response to an input of an obtained second frame image different from the first frame image, the second frame image being obtained by the receiver. The determination processor outputs the information on erroneous detection by the position estimator based on a degree of difference between the first position group and the second position group and a degree of matching between the first frame image and the second frame image.Type: ApplicationFiled: July 7, 2021Publication date: November 16, 2023Inventors: Koki YOSHIDA, Kahori KISE, Koichi MURATA, Nobuya HASHIZUME, Masafumi FURUTA, Shima OKADA
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Publication number: 20230363682Abstract: A seal portion 24 is arranged between a first fixing surface 222 and a second fixing surface 311. A biasing member 25 comes into contact with a tapered surface 332 of a male terminal 331 received in a female terminal 231 and applies a force in a direction in which the male terminal 331 and the female terminal 231 are moved closer to each other. In a state where the male terminal 331 is received in the female terminal 231, the seal portion 24 is compressed by being sandwiched between the first fixing surface 222 and the second fixing surface 311, and a periphery of the male terminal 331 and the female terminal 231 becomes in a state of being sealed by the seal portion 24.Type: ApplicationFiled: September 13, 2021Publication date: November 16, 2023Inventors: Koichi MURATA, Masafumi FURUTA, Kazuaki SHIBATA
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Publication number: 20230346275Abstract: A sensibility measuring method includes measuring, based on a measurement item which corresponds to each of evaluation objects (50), a set of biological information (20), the set each derived from a subject (60) while using each of the evaluation objects (50) on a trial basis, and acquiring an evaluation result (80) for each of the evaluation objects (50), the evaluation result (80) including identification information that enables identification of a rank order in which the evaluation objects (50) are compared with each other, based on the measured set of biological information (20).Type: ApplicationFiled: May 28, 2021Publication date: November 2, 2023Inventors: Toru MIZUMOTO, Akina ICHIOKA, Masafumi FURUTA, Koichi MURATA
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Patent number: 11773216Abstract: A fluorinated ether compound and a composition capable of forming a light resistant surface layer and an article are provided. The fluorinated ether compound of the present invention has a poly(oxyfluoroalkylene) chain, a reactive silyl group and a group (A) represented by —NR—C(O)— (wherein R is a hydrogen atom or an alkyl group), wherein the carbonyl carbon in the group (A) is bonded to a carbon atom, and the poly(oxyfluoroalkyiene) chain is located at the nitrogen end of the group (A).Type: GrantFiled: May 17, 2021Date of Patent: October 3, 2023Assignee: AGC Inc.Inventors: Keigo Matsuura, Eiichiro Anraku, Ryuta Takashita, Koki Watanabe, Makoto Uno, Koichi Murata, Takafumi Kawakami
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Publication number: 20230301574Abstract: A wearable device wearable by a subject includes: a base; a first arm extending from the base; a second arm extending from the base; a first cable disposed along the first arm; a first sensor that is connected to a first end of the first cable, attached to a body of a subject who is wearing the wearable device, and detects physical body data of the subject; and a signal processor that is connected to a second end of the first cable and processes a detection signal from the first sensor. The signal processor is attached to the base.Type: ApplicationFiled: August 12, 2021Publication date: September 28, 2023Inventors: Ryo TAKEGAWA, Koichi MURATA, Masafumi FURUTA
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Publication number: 20230254610Abstract: A data measurement system (10) includes a plurality of measurement apparatuses (130), a signal transmitter (110), and a data processing apparatus (150). The signal transmitter (110) transmits a trigger signal to the plurality of measurement apparatuses (130). The data processing apparatus (150) obtains from each of the plurality of measurement apparatuses (130), measurement data measured during a period between a start signal corresponding to the trigger signal transmitted at first time and an end signal corresponding to the trigger signal transmitted at second time later than the first time. The data processing apparatus (150) temporally aligns start signals in the obtained data with each other and aligns end signals in the obtained data with each other, and presents the measurement data from the plurality of measurement apparatuses (130) to a user.Type: ApplicationFiled: May 11, 2021Publication date: August 10, 2023Inventors: Masafumi FURUTA, Koichi MURATA, Koki YOSHIDA, Yasuyuki URAOKA, Kahori KISE
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Publication number: 20230122016Abstract: Provided are a setting code generating device, an industrial machine, a setting code generating method, and a setting code generating program capable of confirming information output externally from an industrial machine. This setting code generating device is provided with: an identification information output unit for outputting, to a display, identification information relating to an industrial machine, including machine information relating to the industrial machine and state information relating to the state of the industrial machine; a setting code generating unit for generating a setting code obtained by encoding the identification information output by the identification information output unit, on the basis of an instruction received by way of an operating unit; and a setting code output unit for outputting the setting code generated by the setting code generating unit.Type: ApplicationFiled: July 1, 2021Publication date: April 20, 2023Inventors: Koichi MURATA, Masato YAMAMURA, Takahiro KOUJI
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Publication number: 20230095687Abstract: Systems, methods, and apparatuses can accurately determine proper payload transfer from a working implement of a working machine. Such systems, methods, and apparatuses can identify occurrence of a payload discharge event for the working implement; determine whether a position of the working implement at a time of the identification of the occurrence of the payload discharge event is in a preset working area or a preset discharge area; omit the payload discharge event from registration for a tally of discharge material payload amount under a first case where the position of the working implement is determined to be in the working area; and register the payload discharge event for the tally under a second case where the position of the work implement is determined to be in the discharge area. The tally of the discharge material payload amount may be increased by a load amount associated with the load discharge event.Type: ApplicationFiled: September 29, 2021Publication date: March 30, 2023Applicant: Caterpillar SARLInventors: Yozo NAKAMOTO, Michio AOKI, Keisuke SHIRANI, Koichi MURATA, Kensuke TANAKA
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Patent number: 11600538Abstract: A SiC epitaxial wafer according to an embodiment includes: a SiC substrate; and a SiC epitaxial layer formed on a first surface of the SiC substrate. The in-plane uniformity of a density of Z1/2 centers of the SiC epitaxial layer is 5% or less.Type: GrantFiled: November 24, 2021Date of Patent: March 7, 2023Assignee: SHOWA DENKO K.K.Inventors: Naoto Ishibashi, Koichi Murata, Hidekazu Tsuchida
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Patent number: 11601621Abstract: A vehicular display system shows a view image including a blind area with superior visibility. Embodiments include an imaging unit that captures an image of a surrounding area of a vehicle; an image processing unit that converts the image into a view image of the surrounding area of the vehicle seen from inside a cabin; and a display unit. The image processing unit generates a rear-view image acquired when an area behind the vehicle is seen from a first virtual viewpoint located in the cabin, and a front-view image acquired when an area in front of the vehicle is seen from a second virtual viewpoint located behind the first virtual viewpoint in the cabin. The display unit shows the rear-view image when the vehicle travels backward, the front-view image when the vehicle travels forward, and shows both of the view images at substantially the same angle of view.Type: GrantFiled: September 8, 2021Date of Patent: March 7, 2023Assignee: MAZDA MOTOR CORPORATIONInventors: Daichi Sugawara, Koichi Murata, Erika Hori, Tomonori Ohtsubo, Yoshiaki Matsuba
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Publication number: 20220190114Abstract: A vertical metal oxide semiconductor field effect transistor, including a starting substrate of a first conductivity type, a second first-conductivity-type epitaxial layer provided on a first surface of the starting substrate via a first first-conductivity-type epitaxial layer, a first semiconductor region of the first conductivity type provided as a portion of the second first-conductivity-type epitaxial layer, a second-conductivity-type epitaxial layer forming a pn junction interface with the second first-conductivity-type epitaxial layer and supplying a minority carrier to the second first-conductivity-type epitaxial layer, a plurality of second semiconductor regions of the first conductivity type selectively provided in the second-conductivity-type epitaxial layer, a plurality of trenches penetrating through the second semiconductor regions and the second-conductivity-type epitaxial layer, and a plurality of gate electrodes provided in the trenches via gate insulating films.Type: ApplicationFiled: October 29, 2021Publication date: June 16, 2022Applicant: FUJI ELECTRIC CO., LTD.Inventors: Takeshi TAWARA, Hidekazu TSUCHIDA, Koichi MURATA
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Publication number: 20220173001Abstract: A SiC epitaxial wafer according to an embodiment includes: a SiC substrate; and a SiC epitaxial layer formed on a first surface of the SiC substrate. The in-plane uniformity of a density of Z1/2 centers of the SiC epitaxial layer is 5% or less.Type: ApplicationFiled: November 24, 2021Publication date: June 2, 2022Applicant: Showa Denko K.K.Inventors: Naoto ISHIBASHI, Koichi MURATA, Hidekazu TSUCHIDA
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Publication number: 20220146564Abstract: A semiconductor wafer evaluation apparatus brings a contact maker (mercury liquefied at room temperature), as a Schottky electrode, into contact with a semiconductor wafer, intermittently applies a voltage from a pulse power supply, and evaluates the state (kinds, density) of point defects by an evaluation means based on the status of the electrostatic capacity of the semiconductor wafer. In this manner, the state (kinds, density) of the point defects in the plane of a large-diameter semiconductor wafer is directly evaluated using a large table.Type: ApplicationFiled: November 5, 2021Publication date: May 12, 2022Applicant: SHOWA DENKO K.K.Inventors: Koichi Murata, Isaho KAMATA, Hidekazu TSUCHIDA, Akira MIYASAKA
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Publication number: 20220086368Abstract: A vehicular display system shows an image of a surrounding area of a vehicle in a superior visibility mode. Embodiments include an imaging unit that captures an image of the surrounding area of the vehicle; an image processing unit that converts the image captured by the imaging unit into a view image of the area seen from a predetermined virtual viewpoint in the cabin; and a display unit that shows the view image generated by the image processing unit. The image processing unit can generate, as the view image, a first view image acquired when a first direction is seen from the virtual viewpoint, and a second view image acquired when a second direction differing from the first direction is seen from the virtual viewpoint. Each of the first and second view images is shown at a horizontal angle of view that corresponds to a stable visual field.Type: ApplicationFiled: September 8, 2021Publication date: March 17, 2022Applicant: MAZDA MOTOR CORPORATIONInventors: Daichi SUGAWARA, Koichi MURATA, Erika HORI, Tomonori OHTSUBO, Yoshiaki MATSUBA
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Publication number: 20220086400Abstract: A vehicular display system shows a view image including a blind area with superior visibility. Embodiments include an imaging unit that captures an image of a surrounding area of a vehicle; an image processing unit that converts the image into a view image of the surrounding area of the vehicle seen from inside a cabin; and a display unit. The image processing unit generates a rear-view image acquired when an area behind the vehicle is seen from a first virtual viewpoint located in the cabin, and a front-view image acquired when an area in front of the vehicle is seen from a second virtual viewpoint located behind the first virtual viewpoint in the cabin. The display unit shows the rear-view image when the vehicle travels backward, the front-view image when the vehicle travels forward, and shows both of the view images at substantially the same angle of view.Type: ApplicationFiled: September 8, 2021Publication date: March 17, 2022Applicant: MAZDA MOTOR CORPORATIONInventors: Daichi SUGAWARA, Koichi MURATA, Erika HORI, Tomonori OHTSUBO, Yoshiaki MATSUBA
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Patent number: 11183590Abstract: A semiconductor device including a semiconductor substrate of a first conductivity type, a first semiconductor layer of the first conductivity type, provided at a front surface of the semiconductor substrate and having an impurity concentration lower than that of the semiconductor substrate, a second semiconductor layer of a second conductivity type, selectively provided on the first semiconductor layer, a first semiconductor region of the first conductivity type, selectively provided in the second semiconductor layer and having an impurity concentration higher than that of the semiconductor substrate, a trench penetrating the first semiconductor region and the second semiconductor layer, to reach the first semiconductor layer, and a gate electrode provided in the trench, via a gate insulating film. The trench has a sidewall that includes a terrace portion, surface roughness of the terrace portion being at most 0.1 nm.Type: GrantFiled: August 3, 2020Date of Patent: November 23, 2021Assignee: FUJI ELECTRIC CO., LTD.Inventors: Tae Tawara, Shinji Fujikake, Aki Takigawa, Hidekazu Tsuchida, Koichi Murata
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Publication number: 20210269591Abstract: A fluorinated ether compound and a composition capable of forming a light resistant surface layer and an article are provided. The fluorinated ether compound of the present invention has a poly(oxyfluoroalkylene) chain, a reactive silyl group and a group (A) represented by —NR—C(O)— (wherein R is a hydrogen atom or an alkyl group), wherein the carbonyl carbon in the group (A) is bonded to a carbon atom, and the poly(oxyfluoroalkylene) chain is located at the nitrogen end of the group (A).Type: ApplicationFiled: May 17, 2021Publication date: September 2, 2021Applicant: AGC Inc.Inventors: Keigo MATSUURA, Eiichiro ANRAKU, Ryuta TAKASHITA, Koki WATANABE, Makoto UNO, Koichi MURATA, Takafumi KAWAKAMI