Patents by Inventor Koichi Yanagawa
Koichi Yanagawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11872620Abstract: A press brake is provided with a hydraulic cylinder configured to move an upper table and a lower table relative to each other in a vertical direction, and a control unit configured to control a hydraulic circuit of the hydraulic cylinder, in which the control unit manages a predictor of an occurrence of an abnormality in the hydraulic circuit including a first pressure control valve configured to control a back pressure of hydraulic oil on a first port side of the hydraulic cylinder.Type: GrantFiled: August 22, 2019Date of Patent: January 16, 2024Assignee: Amada Co., Ltd.Inventors: Koichi Yanagawa, Tetsuaki Kato, Hidehiko Yoshida
-
Publication number: 20220048086Abstract: A press brake is provided with a hydraulic cylinder configured to move an upper table and a lower table relative to each other in a vertical direction, and a control unit configured to control a hydraulic circuit of the hydraulic cylinder, in which the control unit manages a predictor of an occurrence of an abnormality in the hydraulic circuit including a first pressure control valve configured to control a back pressure of hydraulic oil on a first port side of the hydraulic cylinder.Type: ApplicationFiled: August 22, 2019Publication date: February 17, 2022Inventors: Koichi YANAGAWA, Tetsuaki KATO, Hidehiko YOSHIDA
-
Patent number: 6959573Abstract: A bending apparatus reciprocates at least one of an upper table to which a punch is mounted and a lower table to which a corresponding plurality of adjacent divided dies are mounted. At least one bending angle detector is provided between the dies to detect a bending angle of the workpiece. A main body inserts the bending angle detector into a gap between the dies and withdraws the bending angle detector from the gap between the dies. A lift is biased upward by a first elastic body and is configured to be pressed downward by the workpiece at approximately a center of a groove portion of the dies. The lift includes a first engagement member. A rotor support is biased upward by two second elastic bodies having smaller biasing forces than the first elastic body. The rotor support includes second engagement members. Two rotors are provided on opposite sides of the groove portion at an upper portion of the rotor support. The two rotors include workpiece contacts that contact the workpiece.Type: GrantFiled: August 8, 2001Date of Patent: November 1, 2005Assignee: Amada Company, LimitedInventors: Masateru Matsumoto, Koichi Yanagawa, Ken Hatano, Yutaka Takizawa
-
Publication number: 20040035178Abstract: In a detecting device main body 29 of a bending angle detecting device, a pin shaft 35 having a first engagement member 39 is normally biased upward by a first spring 41 in an approximately center position of a groove portion of a die D. In the detecting device main body 29, a rotor supporting member 47 having second engagement members 61 and 63 is normally biased by two second elastic bodies 49 having weaker biasing force smaller than that of the first spring 41. Two rotors 51 are positioned and borne to both sides of a groove widthwise direction of the die D at the upper portion of the rotor supporting member 47. A forward end of the pin shaft 35 is stopped in a lower position than the upper surface of the die by rotatively link members 43 which are engaged with the first engagement member 39 and second engagement members 61 and 63, and the two rotors 51 are positioned below the upper surface of the die.Type: ApplicationFiled: February 10, 2003Publication date: February 26, 2004Inventors: Masateru Matsumoto, Koichi Yanagawa, Ken Hatano, Yutaka Takizawa
-
Patent number: 6271673Abstract: A probe for measuring signals with a narrow contact pitch comprises an end section having a main tip member and a sub-tip member, each of which passes through one of two holes in a housing. The sub-tip member is electrically connected to the housing and the main-tip member is insulated from the housing by an insulation member. The sub-tip member is pivotally connected to the housing. The subtip member is asymmetric with respect to the pivot and therefore, its sharpened end can trace a circular orbit when the sub-tip member turns on its pivot. The distance between the two end sections of these tip members (that is, the contact pitch) can be set to a desired length by positioning sub-tip sharpened end section to any point on this orbit.Type: GrantFiled: March 27, 1999Date of Patent: August 7, 2001Assignee: Agilent Technologies, Inc.Inventors: Masaji Furuta, Koichi Yanagawa
-
Patent number: 6199610Abstract: An antiskid device (A) mounted to a tread (20) of a tire (2) has a pin (10) and a heat insulating member (11) attached to an end of the pin (10). The pin (10) is made of a material having a higher hardness in a first temperature range not higher than a predetermined temperature and a lower hardness in a second temperature range above the predetermined temperature. The insulating member (11) prohibits heat transfer from the tire (2) to the pin (10).Type: GrantFiled: June 1, 1998Date of Patent: March 13, 2001Assignee: Goichi Rubber Co., Ltd.Inventor: Koichi Yanagawa
-
Patent number: 5661404Abstract: A system and a method are presented which reduce the number of times of connection and disconnection of calibration standards in a circuit network measurement device provided with many measurement ports. The circuit network measurement device generally includes a network analyzer and a test set. A calibration port is provided and typically placed in the test set. The calibration port consists of a connector and three standards (open, short, and load impedances) connected to the connector internally by means of a selection switch. The measurement port of the circuit network measurement device is calibrated by using the three external impedance standards. The calibrator is calibrated by connecting the measurement port calibrated at the former step. Other measurement ports are then connected to the calibrator to be calibrated.Type: GrantFiled: July 17, 1995Date of Patent: August 26, 1997Assignee: Hewlett-Packard CompanyInventors: Koichi Yanagawa, Atsushi Ishihara, Hiroyuki Iwai, Tatsuo Furukawa
-
Patent number: 5523693Abstract: The bridge circuit receives the balance signal output from the balanced signal source, which generates a broad-band balanced signal over a frequency band of a direct current to several tens of MHz as a reflection-characteristic measuring bridge. The balance signal source is constructed by connecting in series the first balance output type circuit whose equivalent circuit is represented by the parallel-connection circuit of the resistor R.sub.1 and the electrostatic capacitor C, and the second balance output type circuit whose equivalent circuit is represented by the parallel-connection circuit of the resistor R.sub.2 and the inductance L, R.sub.1, R.sub.Type: GrantFiled: June 1, 1993Date of Patent: June 4, 1996Assignee: Hewlett-Packard CompanyInventor: Koichi Yanagawa
-
Patent number: 5014012Abstract: For measuring the inductance of a workpiece, a device which includes an inductance meter, respective D.C. and A.C. power sources as well as a guard line circuit. In order to simulate conditions of actual use of the workpiece, the D.C. power source is connected to provide a direct current bias through the workpiece. A measuring current produced by the A.C. power source and applied to the workpiece is detected via the inductance meter. The guard line circuit is coupled so as to prevent any portions of the A.C. measuring signal from undesirably flowing through the D.C. power source.Type: GrantFiled: June 30, 1989Date of Patent: May 7, 1991Assignee: Hewlett-Packard Co.Inventors: Yoichi Kuboyama, Koichi Yanagawa
-
Patent number: 4885528Abstract: The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.Type: GrantFiled: March 3, 1989Date of Patent: December 5, 1989Assignee: Hewlett-Packard CompanyInventors: Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa, Yoichi Kuboyama