Patents by Inventor Koichi Yanagawa

Koichi Yanagawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11872620
    Abstract: A press brake is provided with a hydraulic cylinder configured to move an upper table and a lower table relative to each other in a vertical direction, and a control unit configured to control a hydraulic circuit of the hydraulic cylinder, in which the control unit manages a predictor of an occurrence of an abnormality in the hydraulic circuit including a first pressure control valve configured to control a back pressure of hydraulic oil on a first port side of the hydraulic cylinder.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: January 16, 2024
    Assignee: Amada Co., Ltd.
    Inventors: Koichi Yanagawa, Tetsuaki Kato, Hidehiko Yoshida
  • Publication number: 20220048086
    Abstract: A press brake is provided with a hydraulic cylinder configured to move an upper table and a lower table relative to each other in a vertical direction, and a control unit configured to control a hydraulic circuit of the hydraulic cylinder, in which the control unit manages a predictor of an occurrence of an abnormality in the hydraulic circuit including a first pressure control valve configured to control a back pressure of hydraulic oil on a first port side of the hydraulic cylinder.
    Type: Application
    Filed: August 22, 2019
    Publication date: February 17, 2022
    Inventors: Koichi YANAGAWA, Tetsuaki KATO, Hidehiko YOSHIDA
  • Patent number: 6959573
    Abstract: A bending apparatus reciprocates at least one of an upper table to which a punch is mounted and a lower table to which a corresponding plurality of adjacent divided dies are mounted. At least one bending angle detector is provided between the dies to detect a bending angle of the workpiece. A main body inserts the bending angle detector into a gap between the dies and withdraws the bending angle detector from the gap between the dies. A lift is biased upward by a first elastic body and is configured to be pressed downward by the workpiece at approximately a center of a groove portion of the dies. The lift includes a first engagement member. A rotor support is biased upward by two second elastic bodies having smaller biasing forces than the first elastic body. The rotor support includes second engagement members. Two rotors are provided on opposite sides of the groove portion at an upper portion of the rotor support. The two rotors include workpiece contacts that contact the workpiece.
    Type: Grant
    Filed: August 8, 2001
    Date of Patent: November 1, 2005
    Assignee: Amada Company, Limited
    Inventors: Masateru Matsumoto, Koichi Yanagawa, Ken Hatano, Yutaka Takizawa
  • Publication number: 20040035178
    Abstract: In a detecting device main body 29 of a bending angle detecting device, a pin shaft 35 having a first engagement member 39 is normally biased upward by a first spring 41 in an approximately center position of a groove portion of a die D. In the detecting device main body 29, a rotor supporting member 47 having second engagement members 61 and 63 is normally biased by two second elastic bodies 49 having weaker biasing force smaller than that of the first spring 41. Two rotors 51 are positioned and borne to both sides of a groove widthwise direction of the die D at the upper portion of the rotor supporting member 47. A forward end of the pin shaft 35 is stopped in a lower position than the upper surface of the die by rotatively link members 43 which are engaged with the first engagement member 39 and second engagement members 61 and 63, and the two rotors 51 are positioned below the upper surface of the die.
    Type: Application
    Filed: February 10, 2003
    Publication date: February 26, 2004
    Inventors: Masateru Matsumoto, Koichi Yanagawa, Ken Hatano, Yutaka Takizawa
  • Patent number: 6271673
    Abstract: A probe for measuring signals with a narrow contact pitch comprises an end section having a main tip member and a sub-tip member, each of which passes through one of two holes in a housing. The sub-tip member is electrically connected to the housing and the main-tip member is insulated from the housing by an insulation member. The sub-tip member is pivotally connected to the housing. The subtip member is asymmetric with respect to the pivot and therefore, its sharpened end can trace a circular orbit when the sub-tip member turns on its pivot. The distance between the two end sections of these tip members (that is, the contact pitch) can be set to a desired length by positioning sub-tip sharpened end section to any point on this orbit.
    Type: Grant
    Filed: March 27, 1999
    Date of Patent: August 7, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: Masaji Furuta, Koichi Yanagawa
  • Patent number: 6199610
    Abstract: An antiskid device (A) mounted to a tread (20) of a tire (2) has a pin (10) and a heat insulating member (11) attached to an end of the pin (10). The pin (10) is made of a material having a higher hardness in a first temperature range not higher than a predetermined temperature and a lower hardness in a second temperature range above the predetermined temperature. The insulating member (11) prohibits heat transfer from the tire (2) to the pin (10).
    Type: Grant
    Filed: June 1, 1998
    Date of Patent: March 13, 2001
    Assignee: Goichi Rubber Co., Ltd.
    Inventor: Koichi Yanagawa
  • Patent number: 5661404
    Abstract: A system and a method are presented which reduce the number of times of connection and disconnection of calibration standards in a circuit network measurement device provided with many measurement ports. The circuit network measurement device generally includes a network analyzer and a test set. A calibration port is provided and typically placed in the test set. The calibration port consists of a connector and three standards (open, short, and load impedances) connected to the connector internally by means of a selection switch. The measurement port of the circuit network measurement device is calibrated by using the three external impedance standards. The calibrator is calibrated by connecting the measurement port calibrated at the former step. Other measurement ports are then connected to the calibrator to be calibrated.
    Type: Grant
    Filed: July 17, 1995
    Date of Patent: August 26, 1997
    Assignee: Hewlett-Packard Company
    Inventors: Koichi Yanagawa, Atsushi Ishihara, Hiroyuki Iwai, Tatsuo Furukawa
  • Patent number: 5523693
    Abstract: The bridge circuit receives the balance signal output from the balanced signal source, which generates a broad-band balanced signal over a frequency band of a direct current to several tens of MHz as a reflection-characteristic measuring bridge. The balance signal source is constructed by connecting in series the first balance output type circuit whose equivalent circuit is represented by the parallel-connection circuit of the resistor R.sub.1 and the electrostatic capacitor C, and the second balance output type circuit whose equivalent circuit is represented by the parallel-connection circuit of the resistor R.sub.2 and the inductance L, R.sub.1, R.sub.
    Type: Grant
    Filed: June 1, 1993
    Date of Patent: June 4, 1996
    Assignee: Hewlett-Packard Company
    Inventor: Koichi Yanagawa
  • Patent number: 5014012
    Abstract: For measuring the inductance of a workpiece, a device which includes an inductance meter, respective D.C. and A.C. power sources as well as a guard line circuit. In order to simulate conditions of actual use of the workpiece, the D.C. power source is connected to provide a direct current bias through the workpiece. A measuring current produced by the A.C. power source and applied to the workpiece is detected via the inductance meter. The guard line circuit is coupled so as to prevent any portions of the A.C. measuring signal from undesirably flowing through the D.C. power source.
    Type: Grant
    Filed: June 30, 1989
    Date of Patent: May 7, 1991
    Assignee: Hewlett-Packard Co.
    Inventors: Yoichi Kuboyama, Koichi Yanagawa
  • Patent number: 4885528
    Abstract: The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.
    Type: Grant
    Filed: March 3, 1989
    Date of Patent: December 5, 1989
    Assignee: Hewlett-Packard Company
    Inventors: Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa, Yoichi Kuboyama