Abstract: Provided is a testing apparatus including: a light emission control unit which causes a plurality of light emitting elements to be tested to emit light; a light measurement unit which receives the light emitted from the plurality of light emitting elements and measures wavelengths of the received light; and a determination unit which determines whether there is an abnormality in at least one light emitting element on the basis of intensity distributions of the wavelengths of the light, which is emitted from the plurality of light emitting elements, measured by the light measurement unit. The testing apparatus may further include: a light source; an optical system which irradiates the plurality of light emitting elements with light emitted from the light source; and an electrical measurement unit which measures a photoelectric signal obtained by each of the plurality of light emitting elements photoelectrically converting the light radiated by the optical system.

Abstract: A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

Abstract: A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

Abstract: A test apparatus includes: an electrical connection unit configured to be electrically connected to a light emitting device panel having a plurality of cells each including a light emitting device and arranged in a row direction and a column direction; a light source unit configured to collectively irradiate the plurality of cells with light; a reading unit configured to read, for each row of the light emitting device panel, a photoelectric signal obtained by photoelectrically converting the light in each of two or more of the cells arranged in the column direction by the light emitting device; a measuring unit configured to measure a photoelectric signal read from each of the plurality of cells; and a determination unit configured to determine a quality of each of the plurality of cells on a basis of a measurement result of the measuring unit.

Abstract: A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.

Abstract: A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.

Abstract: A test apparatus includes: an electrical connection unit configured to be electrically connected to a light emitting device panel having a plurality of cells each including a light emitting device and arranged in a row direction and a column direction; a light source unit configured to collectively irradiate the plurality of cells with light; a reading unit configured to read, for each row of the light emitting device panel, a photoelectric signal obtained by photoelectrically converting the light in each of two or more of the cells arranged in the column direction by the light emitting device; a measuring unit configured to measure a photoelectric signal read from each of the plurality of cells; and a determination unit configured to determine a quality of each of the plurality of cells on a basis of a measurement result of the measuring unit.

Abstract: A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.

Abstract: A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

Abstract: A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.

Abstract: A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.