Abstract: The present invention is related to a printed matter on which thin film is formed by a printing method. Functional organic thin film is formed in little process with highly precise on a substrate without water absorbing property sectioned by partition walls. According to the current invention, the printing that accuracy is preferable can be achieved only by alignment in only one direction. In addition, yield of manufacture of printed matter is preferable. In addition, configuration of partition wall is configuration that printing plate is easy to approach one part of partition wall. Therefore, ink is transferred surely from printing plate to a substrate. Even more particularly, problem such as disconnection of the functional layer or substrate on partition wall when the functional layer or substrate is laminated on a top face of printed matter can be prevented.

Abstract: The present invention is related to a printed matter on which thin film is formed by a printing method. Functional organic thin film is formed in little process with highly precise on a substrate without water absorbing property sectioned by partition walls. According to the current invention, the printing that accuracy is preferable can be achieved only by alignment in only one direction. In addition, yield of manufacture of printed matter is preferable. In addition, configuration of partition wall is configuration that printing plate is easy to approach one part of partition wall. Therefore, ink is transferred surely from printing plate to a substrate. Even more particularly, problem such as disconnection of the functional layer or substrate on partition wall when the functional layer or substrate is laminated on a top face of printed matter can be prevented.

Abstract: DC bias currents are applied to a conducting wire of a thin film magnetic head to be inspected. When the DC bias currents (I.sub.0, I.sub.1, I.sub.2) are supplied to the conducting wire, the impedances (Z.sub.0, Z.sub.1, Z.sub.2) corresponding to the DC bias currents are measured. When a ratio (.vertline.Z.sub.1 -Z.sub.0 .vertline./.vertline.Z.sub.2 -Z.sub.0 .vertline.) corresponding to an overwrite characteristic (OW) reaches to a predetermined value by lapping tip portions of an upper magnetic layer and a lower magnetic layer of the magnetic head, the lapping process of the magnetic head is finished.