Patents by Inventor KRISHNA SHRINIVAS NAYAK

KRISHNA SHRINIVAS NAYAK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11412948
    Abstract: Tracer kinetic models are utilized as temporal constraints for highly under-sampled reconstruction of DCE-MRI data. The method is flexible in handling any TK model, does not rely on tuning of regularization parameters, and in comparison to existing compressed sensing approaches, provides robust mapping of TK parameters at high under-sampling rates. In summary, the method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than existing methods. In another embodiment, TK parameter maps are directly reconstructed from highly under-sampled DCE-MRI data. This method provides more accurate TK parameter values and higher under-sampling rates. It does not require tuning parameters and there are not additional intermediate steps. The proposed method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than conventional indirect methods.
    Type: Grant
    Filed: May 15, 2017
    Date of Patent: August 16, 2022
    Assignee: University of Southern California
    Inventors: Krishna Shrinivas Nayak, Yi Guo, Robert Marc Lebel, Yinghua Zhu, Sajan Goud Lingala
  • Publication number: 20170325709
    Abstract: Tracer kinetic models are utilized as temporal constraints for highly under-sampled reconstruction of DCE-MRI data. The method is flexible in handling any TK model, does not rely on tuning of regularization parameters, and in comparison to existing compressed sensing approaches, provides robust mapping of TK parameters at high under-sampling rates. In summary, the method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than existing methods. In another embodiment, TK parameter maps are directly reconstructed from highly under-sampled DCE-MRI data. This method provides more accurate TK parameter values and higher under-sampling rates. It does not require tuning parameters and there are not additional intermediate steps. The proposed method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than conventional indirect methods.
    Type: Application
    Filed: May 15, 2017
    Publication date: November 16, 2017
    Inventors: KRISHNA SHRINIVAS NAYAK, YI GUO, ROBERT MARC LEBEL, YINGHUA ZHU, SAJAN GOUD LINGALA