Abstract: A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.

Abstract: A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.

Abstract: A device includes an RC oscillator circuit and incorporates various features that individually and in combination can help improve the stability or accuracy of the oscillator output frequency. The oscillator circuit is operable to provide a tunable output frequency and includes a bias circuit switchable between first and second modes of operation. One of the modes has less drift in oscillator bias current relative to the other mode. The device also includes drift compensation circuitry that is operable to compensate for drift in the oscillator output frequency in a closed-loop mode of operation based on a comparison of the oscillator output frequency with a reference frequency. The device further includes a processor operable to compensate for temperature-based drift in the oscillator frequency in an open-loop mode of operation based on a measured temperature value in the vicinity of the oscillator circuit.

Abstract: A device includes an RC oscillator circuit and incorporates various features that individually and in combination can help improve the stability or accuracy of the oscillator output frequency. The oscillator circuit is operable to provide a tunable output frequency and includes a bias circuit switchable between first and second modes of operation. One of the modes has less drift in oscillator bias current relative to the other mode. The device also includes drift compensation circuitry that is operable to compensate for drift in the oscillator output frequency in a closed-loop mode of operation based on a comparison of the oscillator output frequency with a reference frequency. The device further includes a processor operable to compensate for temperature-based drift in the oscillator frequency in an open-loop mode of operation based on a measured temperature value in the vicinity of the oscillator circuit.