Patents by Inventor Kuen-Wey Shieh

Kuen-Wey Shieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8540504
    Abstract: An electrospinning equipment is provided. The electrospinning equipment includes a power supply, a collector and a material supply electrically connected to the power supply facing the collector and having a spinneret and a guide unit coupled to the spinneret and bent toward the collector, and the spinneret is configured at a central portion of the guide unit.
    Type: Grant
    Filed: March 15, 2010
    Date of Patent: September 24, 2013
    Assignees: National Applied Research Laboratories, Taipei Medical University
    Inventors: Kuen-Wey Shieh, Chien-Chung Chen, Yung-Sheng Lin
  • Publication number: 20100173035
    Abstract: An electrospinning equipment is provided. The electrospinning equipment includes a power supply, a collector and a material supply electrically connected to the power supply facing the collector and having a spinneret and a guide unit coupled to the spinneret and bent toward the collector, and the spinneret is configured at a central portion of the guide unit.
    Type: Application
    Filed: March 15, 2010
    Publication date: July 8, 2010
    Applicants: NATIONAL APPLIED RESEARCH LABORATORIES, TAIPEI MEDICAL UNIVERSITY
    Inventors: Kuen-Wey Shieh, Chien-Chung Chen, Yung-Sheng Lin
  • Publication number: 20080258351
    Abstract: An electrospinning equipment is provided. The electrospinning equipment includes a power supply, a collector and a material supply electrically connected to the power supply facing the collector and having a spinneret and a guide unit coupled to the spinneret and bent toward the collector, and the spinneret is configured at a central portion of the guide unit.
    Type: Application
    Filed: October 23, 2007
    Publication date: October 23, 2008
    Applicants: NATIONAL APPLIED RESEARCH LABORATORIES, TAIPEI MEDICAL UNIVERSITY
    Inventors: Kuen-Wey Shieh, Chien-Chung Chen, Yung-Sheng Lin
  • Patent number: 7317575
    Abstract: A novel dispersion optical system based on at least one grating is provided. The pitches of the grating are linearly modulated so that the incident light is dispersed into different monochromatic light at different diffraction angles. In such a system, an order sorting filter is not required to separate the light of a selected order from the rest of unwanted overlapped order.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: January 8, 2008
    Assignee: Instrument Technology Research Center
    Inventors: Kuen-Wey Shieh, Jerwei Hsieh, Hsiao-yu Chou
  • Publication number: 20060169881
    Abstract: A novel dispersion optical system based on at least one grating is provided. The pitches of the grating are linearly modulated so that the incident light is dispersed into different monochromatic light at different diffraction angles. In such a system, an order sorting filter is not required to separate the light of a selected order from the rest of unwanted overlapped order.
    Type: Application
    Filed: July 14, 2005
    Publication date: August 3, 2006
    Inventors: Kuen-Wey Shieh, Jerwei Hsieh, Hsiao-yu Chou
  • Patent number: 6674281
    Abstract: The present invention provides a method for measuring both magnetic and electric fields of a DUT via an electro-optic probing technique at the same time. Also, the present invention provides a method for measuring both electric and magnetic fields via a magneto-optic probing technique simultaneously. The method utilizes the modulation of the position of a probe to measure the electric and magnetic field signals. The DC and AC components of the modulated electric (or magnetic) field signals can be obtained by means of a low pass filter and a lock-in amplifier, respectively. Through a simple calculation, the electric and magnetic field can be obtained simultaneously.
    Type: Grant
    Filed: March 18, 2002
    Date of Patent: January 6, 2004
    Assignee: Precision Instrument Development Center National Science Council
    Inventor: Kuen-Wey Shieh
  • Publication number: 20030173960
    Abstract: The present invention provides a method for measuring both magnetic and electric fields of a DUT via an electro-optic probing technique at the same time. Also, the present invention provides a method for measuring both electric and magnetic fields via a magneto-optic probing technique simultaneously. The method utilizes the modulation of the position of a probe to measure the electric and magnetic field signals. The DC and AC components of the modulated electric (or magnetic) field signals can be obtained by means of a low pass filter and a lock-in amplifier, respectively. Through a simple calculation, the electric and magnetic field can be obtained simultaneously.
    Type: Application
    Filed: March 18, 2002
    Publication date: September 18, 2003
    Applicant: Precision Instrument Development Center, National Science Council
    Inventor: Kuen-Wey Shieh