Abstract: A multilayer coil component includes an element body, a coil including a plurality of internal conductors, and a plurality of stress-relaxation spaces. The plurality of internal conductors are separated from each other in a first direction in the element body. Each stress-relaxation space is in contact with a surface of the corresponding internal conductor and powders exist in each stress-relaxation space. The element body includes element body regions located between the internal conductors adjacent to each other in the first direction. Each stress-relaxation space includes a first boundary surface with each internal conductor and a second boundary surface with each element body region. The first boundary surface and the second boundary surface oppose each other in the first direction. A distance between the first boundary surface and the second boundary surface is smaller than a thickness of each element body region in the first direction.

Abstract: In a multilayer coil component, an end of a lower coil layer and an end of a connecting part are directly overlapped, and the end of the lower coil layer includes a contact edge positioned on a side of the connecting part and being in contact with the connecting part and a non-contact edge positioned on a side opposite to the connecting part and not being in contact with the connecting part. Then, the contact edge and the non-contact edge are not overlapped when viewed from a laminated direction. Consequently, a propagation distance of a crack becomes longer as compared with the case where an end face is parallel to the laminated direction, effectively suppressing advance of the crack. Suppressed advance of a crack in this manner makes the multilayer coil component provide a high component strength as a whole.

Abstract: A soft magnetic metal powder includes a plurality of soft magnetic metal grains composed of an Fe—Si based alloy. A content of P in the Fe—Si based alloy is 110 to 650 ppm provided that a total content of Fe and Si is 100 mass %. A soft magnetic metal fired body includes soft magnetic metal fired grains composed of an Fe—Si based alloy. A content of P in the Fe—Si based alloy is 110 to 650 ppm provided that a total content of Fe and Si is 100 mass %.

Abstract: A multilayer coil component includes an element body including soft magnetic metal powders and a coil disposed in the element body. The coil includes a plurality of internal conductors electrically connected to each other. The plurality of internal conductors are separated from each other in a first direction and are adjacent to each other in the first direction. An average particle diameter of the soft magnetic metal powders located at an inner side of the coil when viewing from the first direction is larger than an average particle diameter of the soft magnetic metal powders located between the internal conductors adjacent to each other in the first direction.

Abstract: The present invention provides a multilayer coil electronic component having improved inductance L, Q, and strength. The multilayer coil electronic component has an element in which a coil conductor and a magnetic element body are stacked. The magnetic element body includes soft magnetic metal particles and a resin. The resin fills a space between the soft magnetic metal particles. Each of soft magnetic metal particles has a soft magnetic metal particle core and an oxide film covering the soft magnetic metal particle core. A layer of the oxide film contacting the soft magnetic metal particle core is made of an oxide including Si.

Abstract: In a stepwise structure formed in a multilayer coil component, a difference occurs in a shrinkage amount between a maximum film thickness portion in which the number of layers is large and a minimum film thickness portion in which the number of layers is small due to portions different in the number of layers of coil parts (that is, upper coil part, lower coil part, and connecting part) adjacent to each other like the maximum film thickness portion and the minimum film thickness portion, readily causing a crack by an inner stress due to the difference in the shrinkage amount. In a multilayer coil component according to the present disclosure, a stress relaxation part overlapping with a maximum film thickness portion whose shrinkage amount is large is provided to relax inner stress in a stepwise structure, resulting in prevention of a crack.

Abstract: In a multilayer coil component, an end of a lower coil layer and an end of a connecting part are directly overlapped, and the end of the lower coil layer includes a contact edge positioned on a side of the connecting part and being in contact with the connecting part and a non-contact edge positioned on a side opposite to the connecting part and not being in contact with the connecting part. Then, the contact edge and the non-contact edge are not overlapped when viewed from a laminated direction. Consequently, a propagation distance of a crack becomes longer as compared with the case where an end face is parallel to the laminated direction, effectively suppressing advance of the crack. Suppressed advance of a crack in this manner makes the multilayer coil component provide a high component strength as a whole.

Abstract: A multilayer coil component includes an element body, a coil including a plurality of internal conductors, and a plurality of stress-relaxation spaces. The plurality of internal conductors are separated from each other in a first direction in the element body. Each stress-relaxation space is in contact with a surface of the corresponding internal conductor and powders exist in each stress-relaxation space. The element body includes element body regions located between the internal conductors adjacent to each other in the first direction. Each stress-relaxation space includes a first boundary surface with each internal conductor and a second boundary surface with each element body region. The first boundary surface and the second boundary surface oppose each other in the first direction. A distance between the first boundary surface and the second boundary surface is smaller than a thickness of each element body region in the first direction.

Abstract: Each of internal conductors includes an annular portion with two end portions and an extension portion extending along the one end portion from the other end portion and separated from the one end portion. An edge of the one end portion and an edge of the other end portion oppose each other. The internal conductors include two first internal conductors and a second internal conductor located between the first internal conductors in a first direction. The one end portion of at least one first internal conductor includes a first portion overlapping the edges of the two end portions of the second internal conductor and a second portion overlapping a region between the edges of the two end portions of the second internal conductor, when viewed from the first direction. The second portion is recessed at a side opposite to the region, as compared with the first portion.

Abstract: A coil includes a plurality of internal conductors that are electrically connected to each other and are disposed in an element body having magnetism. The plurality of internal conductors includes conductor portions that are separated from each other in a first direction and overlap each other when viewed from the first direction. At least one low-permeability layer is disposed along the conductor portions between the internal conductors adjacent to each other in the first direction. Permeability of the low-permeability layer is lower than permeability of the element body. The low-permeability layer includes a first portion contacting the internal conductors and at least one second portion separated from the internal conductors in the first direction, between the internal conductors adjacent to each other. The element body includes first element body regions that are interposed between the second portion and the internal conductors.

Abstract: A multilayer coil component includes an element body including soft magnetic metal powders and a coil disposed in the element body. The coil includes a plurality of internal conductors electrically connected to each other. The plurality of internal conductors are separated from each other in a first direction and are adjacent to each other in the first direction. An average particle diameter of the soft magnetic metal powders located at an inner side of the coil when viewing from the first direction is larger than an average particle diameter of the soft magnetic metal powders located between the internal conductors adjacent to each other in the first direction.

Abstract: A soft magnetic metal powder includes a plurality of soft magnetic metal grains composed of an Fe—Si based alloy. A content of P in the Fe—Si based alloy is 110 to 650 ppm provided that a total content of Fe and Si is 100 mass %. A soft magnetic metal fired body includes soft magnetic metal fired grains composed of an Fe—Si based alloy. A content of P in the Fe—Si based alloy is 110 to 650 ppm provided that a total content of Fe and Si is 100 mass %.

Abstract: A coil includes a plurality of internal conductors that are electrically connected to each other and are disposed in an element body having magnetism. The plurality of internal conductors includes conductor portions that are separated from each other in a first direction and overlap each other when viewed from the first direction. At least one low-permeability layer is disposed along the conductor portions between the internal conductors adjacent to each other in the first direction. Permeability of the low-permeability layer is lower than permeability of the element body. The low-permeability layer includes a first portion contacting the internal conductors and at least one second portion separated from the internal conductors in the first direction, between the internal conductors adjacent to each other. The element body includes first element body regions that are interposed between the second portion and the internal conductors.

Abstract: Each of internal conductors includes an annular portion with two end portions and an extension portion extending along the one end portion from the other end portion and separated from the one end portion. An edge of the one end portion and an edge of the other end portion oppose each other. The internal conductors include two first internal conductors and a second internal conductor located between the first internal conductors in a first direction. The one end portion of at least one first internal conductor includes a first portion overlapping the edges of the two end portions of the second internal conductor and a second portion overlapping a region between the edges of the two end portions of the second internal conductor, when viewed from the first direction. The second portion is recessed at a side opposite to the region, as compared with the first portion.

Abstract: Provided is a test apparatus that tests a memory under test including a plurality of repair regions for repairing fails in a memory region, the test apparatus comprising a testing section that sequentially tests each of a plurality of portions of the memory region of the memory under test; a repair solution memory that stores a repair solution indicating which repair region replaces a fail portion of the memory under test; and an updating section that, during testing, in response to a new fail portion being detected by the testing section, updates the repair solution stored in the repair solution memory to be a repair solution that also repairs the newly detected fail portion.

Abstract: Provided is a test apparatus that tests a device under test, comprising a test module that transmits and receives signals to and from the device under test; and a test control section that executes a test program for testing the device under test and that instructs the test module to execute a function designated by the test program from among a plurality of functions of the test module. The test module includes a signal input/output section that transmits and receives signals to and from the device under test; and a module control section that executes a function program according to the function designated by the test program and that accesses at least one of a register and a memory in the signal input/output section.

Abstract: There is provided a test apparatus including a plurality of test signal feeding sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of test signal feeding sections feeds a test signal designed to test a corresponding one of the plurality of memories under test to the corresponding memory under test, a plurality of defect detecting sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of defect detecting sections detects a defect in a corresponding one of the plurality of memories under test, a plurality of first calculating sections that are provided in a one-to-one correspondence with the plurality of memories under test, where each of the plurality of first calculating sections calculates a remedy solution for a corresponding one of the plurality of memories under test and the remedy solution remedies the defect in the corresponding memory under test by repl

Abstract: A multilayer inductor component has a multilayer part having a plurality of magnetic layers laminated therein and a conductor part arranged within the multilayer part. The magnetic layers are formed from a ferrite material and an additive. The ferrite material contains Fe2O3, NiO, CuO, and ZnO. Fe2O3 is 30 to 45 mol %. NiO is 45 to 58 mol %. CuO is 6 to 10 mol %. ZnO is 0 to 3 mol %. The additive contains CoO. The content of CoO is 0.1 to 2.5 mass % with respect to the ferrite material as a whole. The multilayer inductor component has an impedance peak of 500 ? or greater at an operating frequency of 1 GHz or higher.

Abstract: A laminated inductor, as well as a method of manufacturing such a laminated inductor, are provided. The laminated inductor includes: a laminate; a pair of external electrodes arranged on the outer surfaces of the laminate respectively; and a coil, arranged within the laminate and formed by electrically connecting a plurality of strip-like conductor patterns. The conductor patterns have: a pair of broad faces, intersecting the lamination direction and mutually opposing; and peripheral side faces adjacent to the pair of broad faces and extending in the lamination direction. The peripheral side faces are concavo-convex faces, in which concave portions and convex portions are arranged in alternation in the lamination direction. The laminate enters into the concave portions of the peripheral side faces.

Abstract: A laminated inductor, in which there is extremely little tendency for cracking to occur between adjacent conductor patterns in portions of a laminate in the lamination direction even when the conductor pattern thickness is large, as well as a method of manufacturing such a laminated inductor, are provided. A laminated inductor includes: a laminate; a pair of external electrodes arranged on the outer surfaces of the laminate respectively; and a coil, arranged within the laminate and formed by electrically connecting a plurality of strip-like conductor patterns. The conductor patterns have: a pair of broad faces, intersecting the lamination direction and mutually opposing; and peripheral side faces adjacent to the pair of broad faces and extending in the lamination direction. The peripheral side faces are concavo-convex faces, in which concave portions and convex portions are arranged in alternation in the lamination direction. The laminate enters into the concave portions of the peripheral side faces.