Patents by Inventor Kunihiro Maki

Kunihiro Maki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240035878
    Abstract: A wearable sensing device includes: a sensor provided on clothing worn by a worker wearing conductive work clothes; and an electronic device connected to the sensor. The electronic device includes a ground connection part that makes contact with the conductive work clothes to be electrically connected to the conductive work clothes.
    Type: Application
    Filed: October 11, 2023
    Publication date: February 1, 2024
    Inventors: Hiroshi KUNIMOTO, Takeshi UEDA, Suguru NAKAO, Kei TASAKA, Kunihiro MAKI, Yuki IWAMOTO
  • Publication number: 20240036647
    Abstract: A wearable sensing device includes clothing worn by a user, and a sensor unit including a sensor and being attached to the clothing. The sensor unit includes: a body; first and second bracket parts provided to sandwich the body and fixed to the clothing; and first and second hinge parts respectively coupling the body and first and second bracket parts. The first and second bracket parts of the sensor unit are respectively attached to first and second sensor attachment parts provided on clothing 22L.
    Type: Application
    Filed: October 11, 2023
    Publication date: February 1, 2024
    Inventors: Takeshi UEDA, Suguru NAKAO, Kei TASAKA, Kunihiro MAKI, Yuki IWAMOTO, Hiroshi KUNIMOTO
  • Patent number: 9092361
    Abstract: It is possible to accurately detect a physical block which has caused a fixture defect in a flash memory so as to limit the use of the physical block. By recording a history of generation of a physical block error and a history of physical erasing in an ECC error record, it is judged whether the error which has occurred is accidental or caused by a fixture defect. When no error is caused in the data written by physical erasing after a first read error occurrence, the first error is accidental and if another error is caused, the error is judged to be caused by a fixture defect. By using such an ECC error record, it is possible to accurately judge whether the error is accidental or caused by a fixture defect. By eliminating use of the physical block judged to have a fixture defect, it is possible to reduce read errors.
    Type: Grant
    Filed: July 13, 2006
    Date of Patent: July 28, 2015
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Toshiyuki Honda, Kunihiro Maki, Shigekazu Kogita
  • Patent number: 8327068
    Abstract: In a storage having a nonvolatile RAM of destructive read type, the number of restorations attributed to data read from the nonvolatile RAM is decreased, and the overall life of the storage is prolonged. In a storage having a nonvolatile RAM of destructive read type and a volatile RAM and holding the same data in the nonvolatile and volatile RAMs, data is read out of the volatile RAM in reading and data is written in both volatile and nonvolatile RAMs in writing.
    Type: Grant
    Filed: March 1, 2006
    Date of Patent: December 4, 2012
    Assignee: Panasonic Corporation
    Inventors: Masahiro Nakanishi, Tomoaki Izumi, Tetsushi Kasahara, Kazuaki Tamura, Kiminori Matsuno, Manabu Inoue, Masayuki Toyama, Kunihiro Maki
  • Publication number: 20100318723
    Abstract: A nonvolatile memory device includes a plurality of memory controllers. Each of the memory controllers has an aggregation processing part and an aggregation synchronization part. Based on a signal from the aggregation synchronization part, the aggregation processing part aggregates valid data of a temporary physical block into another physical block. When one of the memory controllers requires an aggregation process, the aggregation synchronization part sends a synchronization signal to the other memory controller, so that the aggregation process is simultaneously carried out by the other memory controller. Thus, in the nonvolatile memory device having a plurality of memory controllers, it is possible to reduce the time required for the aggregation process and carry out a high-speed writing process.
    Type: Application
    Filed: January 29, 2008
    Publication date: December 16, 2010
    Inventors: Masahiro Nakanishi, Tetsushi Kasahara, Takefumi Sugai, Hironori Mori, Kunihiro Maki, Kazuaki Tamura
  • Publication number: 20100082878
    Abstract: Used is a nonvolatile memory such as a multi-level NAND flash memory having memory cells for holding data of a plurality of pages. When the data is to be written in the nonvolatile memory 110, a physical unit is consisted in units of a plurality of paired pages. When all the physical units cannot be written, the data is copied from an old physical block holding an already written effective data, and is written in a new physical block till the written, from the first section of a new physical unit, so that an error can be prevented.
    Type: Application
    Filed: May 24, 2006
    Publication date: April 1, 2010
    Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
    Inventors: Manabu Inoue, Masahiro Nakanichi, Tomoaki Izumi, Hironori Mori, Kunihiro Maki, Toshiyuki Honda
  • Publication number: 20090055680
    Abstract: It is possible to accurately detect a physical block which has caused a fixture defect in a flash memory so as to limit the use of the physical block. By recording a history of generation of a physical block error and a history of physical erasing in an ECC error record, it is judged whether the error which has occurred is accidental or caused by a fixture defect. When no error is caused in the data written by physical erasing after a first read error occurrence, the first error is accidental and if another error is caused, the error is judged to be caused by a fixture defect. By using such an ECC error record, it is possible to accurately judge whether the error is accidental or caused by a fixture defect. By eliminating use of the physical block judged to have a fixture defect, it is possible to reduce read errors.
    Type: Application
    Filed: July 13, 2006
    Publication date: February 26, 2009
    Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
    Inventors: Toshiyuki Honda, Kunihiro Maki, Shigekazu Kogita
  • Publication number: 20080307152
    Abstract: In a storage having a nonvolatile RAM of destructive read type, the number of restorations attributed to data read from the nonvolatile RAM is decreased, and the overall life of the storage is prolonged. In a storage having a nonvolatile RAM of destructive read type and a volatile RAM and holding the same data in the nonvolatile and volatile RAMs, data is read out of the volatile RAM in reading and data is written in both volatile and nonvolatile RAMs in writing.
    Type: Application
    Filed: March 1, 2006
    Publication date: December 11, 2008
    Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
    Inventors: Masahiro Nakanishi, Tomoaki Izumi, Tetsushi Kasahara, Kazuaki Tamura, Kiminori Matsuno, Manabu Inoue, Masayuki Toyama, Kunihiro Maki
  • Publication number: 20080250188
    Abstract: A physical area management table (105) and a pointer table (106) are stored in a nonvolatile auxiliary storage memory (107). When a logical-physical conversion table (108) is updated (restored) in a main storage memory (140), the restored area is determined in a re-arrangement way by the pointer table to avoid rewrite concentration on the main storage memory (140). Immediately after data is written in the main storage memory (140), the state of the physical block on the physical area management table (105) is updated. Consequently, even if power interruption occurs, it is possible to reliably judge if the data is valid or not.
    Type: Application
    Filed: November 17, 2005
    Publication date: October 9, 2008
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Masahiro Nakanishi, Tomoaki Izumi, Tetsushi Kasahara, Kazuaki Tamura, Kiminori Matsuno, Manabu Inoue, Masayuki Toyama, Kunihiro Maki