Patents by Inventor Kunikazu Taguchi
Kunikazu Taguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11215443Abstract: An optical measurement apparatus including: an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generType: GrantFiled: September 28, 2020Date of Patent: January 4, 2022Assignee: Otsuka Electronics Co., Ltd.Inventor: Kunikazu Taguchi
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Publication number: 20210223028Abstract: An optical measurement apparatus including: an irradiation optical system configured to irradiate a measurement subject with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the measurement subject as a result of the measurement subject being irradiated with the irradiation light; and a polarizing plate, wherein the polarizing plate is configured to be able to be provided in either the irradiation optical system or the reception optical system.Type: ApplicationFiled: December 11, 2020Publication date: July 22, 2021Applicant: Otsuka Electronics Co., Ltd.Inventors: Kunikazu TAGUCHI, Suguru IRIE
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Publication number: 20210123721Abstract: An optical measurement apparatus including: an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generType: ApplicationFiled: September 28, 2020Publication date: April 29, 2021Applicant: Otsuka Electronics Co., Ltd.Inventor: Kunikazu TAGUCHI
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Patent number: 10309767Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.Type: GrantFiled: June 4, 2018Date of Patent: June 4, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki Inoue, Kunikazu Taguchi
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Patent number: 10288412Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.Type: GrantFiled: June 4, 2018Date of Patent: May 14, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki Inoue, Kunikazu Taguchi
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Publication number: 20180347965Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Applicant: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
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Publication number: 20180347964Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Applicant: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
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Patent number: 8941829Abstract: A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.Type: GrantFiled: February 16, 2012Date of Patent: January 27, 2015Assignee: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki Sano, Kunikazu Taguchi
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Patent number: 8456638Abstract: An optical measurement apparatus includes a spectroscopic measurement device, a first optical fiber for propagating light to be measured, a hemispherical portion having a light diffuse reflection layer on an inner wall of the hemispherical portion, and a plane portion disposed to close an opening of the hemispherical portion and having a mirror reflection layer located to face the inner wall of the hemispherical portion. The plane portion includes a first window for directing the light emitted thorough the first optical fiber into an integrating space. The integrating space is formed by the hemispherical portion and the plane portion. The optical measurement apparatus further includes a second optical fiber for propagating the light in the integrating space to the spectroscopic measurement device through a second window of the plane portion.Type: GrantFiled: February 25, 2011Date of Patent: June 4, 2013Assignee: Otsuka Electronics Co., Ltd.Inventors: Kazuaki Ohkubo, Kunikazu Taguchi
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Publication number: 20120229803Abstract: A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.Type: ApplicationFiled: February 16, 2012Publication date: September 13, 2012Applicant: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki SANO, Kunikazu TAGUCHI
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Publication number: 20110235036Abstract: An optical measurement apparatus includes a spectroscopic measurement device, a first optical fiber for propagating light to be measured, a hemispherical portion having a light diffuse reflection layer on an inner wall of the hemispherical portion, and a plane portion disposed to close an opening of the hemispherical portion and having a mirror reflection layer located to face the inner wall of the hemispherical portion. The plane portion includes a first window for directing the light emitted thorough the first optical fiber into an integrating space. The integrating space is formed by the hemispherical portion and the plane portion. The optical measurement apparatus further includes a second optical fiber for propagating the light in the integrating space to the spectroscopic measurement device through a second window of the plane portion.Type: ApplicationFiled: February 25, 2011Publication date: September 29, 2011Applicant: Otsuka Electronics Co., Ltd.Inventors: Kazuaki OHKUBO, Kunikazu Taguchi
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Patent number: 6922247Abstract: In an automatic optical measurement method according to the invention, with a movable reflection plate 6 moved to place under an optical axis, light projected from a light projecting portion 3a is received by a light receiving portion 3b via the movable reflection plate 6, a stationary reflection plate 11 and the movable reflection plate 6, whereas with the movable reflection plate 6 moved away from the optical axis and a reference 8 set on a sample stage 10, light projected from the light projecting portion 3a is received by the light receiving portion 3b via the reference 8 whereby a ratio between the intensities of the received lights is determined.Type: GrantFiled: July 26, 2001Date of Patent: July 26, 2005Assignee: Otsuka Electronics Co., Ltd.Inventors: Naoki Inamoto, Yoshimi Sawamura, Shinji Fujimura, Kunikazu Taguchi
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Publication number: 20040189979Abstract: There is presented a multipoint measurement system comprising light sources (1, 2); a plurality of illuminating fibers (5, 6) for transmitting light from the light sources to a sample so as to illuminate a plurality of points of the sample (A, B); a plurality of receiving fibers (8, 9) for collecting light beams including transmitted, reflected, scattered light beams at the plurality of points; a beam selector (10) which comprises a rotatable disk (12) having an aperture for transmitting a light beam collected by one of the plurality of receiving fibers (8, 9) through the receiving fiber (11); and an MCPD (4). When the rotatable disk (12) is rotated so that the aperture is displaced to and stops at a position at which light at the desired channel passes through, it is possible to perform measurement only on the light passing through the corresponding receiving fiber (8, 9, 11). Light at any other channel may be measured by rotating the rotatable disk (12) by a predetermined angle.Type: ApplicationFiled: February 11, 2004Publication date: September 30, 2004Inventors: Shinji Fujimura, Tatsuya Harina, Kunikazu Taguchi
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Publication number: 20030147081Abstract: In an automatic optical measurement method according to the invention, with a movable reflection plate 6 moved to place under an optical axis, light projected from a light projecting portion 3a is received by a light receiving portion 3b via the movable reflection plate 6, a stationary reflection plate 11 and the movable reflection plate 6, whereas with the movable reflection plate 6 moved away from the optical axis and a reference 8 set on a sample stage 10, light projected from the light projecting portion 3a is received by the light receiving portion 3b via the reference 8 whereby a ratio between the intensities of the received lights is determined.Type: ApplicationFiled: January 27, 2003Publication date: August 7, 2003Inventors: Naoki Inamoto, Yoshimi Sawamura, Shinji Fujimura, Kunikazu Taguchi