Abstract: A method according to a first aspect may include performing a first analog-to-digital (A/D) conversion using an A/D converter. Data associated with this first A/D conversion may be read using a processor. A command may then be issued from a processor when the reading of the data has started. This command may instruct the A/D converter to perform a second A/D conversion. This data may then be stored in a data structure located within a memory device while the A/D converter is performing the second A/D conversion. In addition to performing such pipelined A/D conversions, the present invention may include a system, method and software for filtering out noise in a voltage measurement after the voltage measurement has been converted to a digital signal by omitting the highest and lowest voltage values and averaging the remainder of the voltage values, thereby reducing noise in the voltage measurements.

Abstract: A method according to a first aspect may include performing a first analog-to-digital (A/D) conversion using an A/D converter. Data associated with this first A/D conversion may be read using a processor. A command may then be issued from a processor when the reading of the data has started. This command may instruct the A/D converter to perform a second A/D conversion. This data may then be stored in a data structure located within a memory device while the A/D converter is performing the second A/D conversion. In addition to performing such pipelined A/D conversions, the present invention may include a system, method and software for filtering out noise in a voltage measurement after the voltage measurement has been converted to a digital signal by omitting the highest and lowest voltage values and averaging the remainder of the voltage values, thereby reducing noise in the voltage measurements.