Patents by Inventor Kyouichi Yamamoto

Kyouichi Yamamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7042425
    Abstract: A display device for realizing gray-scale display by changing an amplitude of a modulation voltage which is output from a data-side driving circuit. A driving control circuit is capable of supplying a first display data signal representing (m+n) grades, obtained by adding m grades represented by a second display data signal externally input and an adjustable range n. The data-side driving circuit is capable of outputting modulation voltages having (m+n) types of amplitudes to a plurality of first electrodes in accordance with a first display data signal. The amplitude of the modulation voltage corresponding to the light emission characteristic of a prescribed light emitting layer among a plurality of light emitting layers is adjusted to an amplitude in the adjustable range n from the amplitude corresponding to the grade represented by the second display data signal.
    Type: Grant
    Filed: September 26, 2002
    Date of Patent: May 9, 2006
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Hisashi Yamaguchi, Kyouichi Yamamoto
  • Patent number: 6661503
    Abstract: A method of manufacturing an optic transmission module assures a high reliability for the module by inspecting the character of a low bit error rate (BER) of the module quickly and accurately. The module is employed in an optical communication system (light transmission system) required to cope with information communication systems that are becoming faster and faster in operation and larger and larger in capacity. Also disclosed is a system and a method for inspection of the BER character which uses a rectangular wave pulse as an interference light to calculate a degradation quantity of a signal-to-noise ratio (S/N) on the basis of a simple theory, thereby inspecting the BER character by extrapolating a case in which there is no interference light (S/X=∞ or X=0) with use of a sign error rate theoretical value according to a bit error rate of a light signal measured according to the degradation quantity.
    Type: Grant
    Filed: May 12, 2000
    Date of Patent: December 9, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Kazuo Yamaguchi, Takashi Minato, Shinzoo Nishiyama, Atsushi Murata, Naohiko Baba, Tsutomu Yoshiya, Kazumi Kawamoto, Kyouichi Yamamoto, Kazuo Aoyama
  • Publication number: 20030132899
    Abstract: A display device for realizing gray-scale display by changing an amplitude of a modulation voltage which is output from a data-side driving circuit. A driving control circuit is capable of supplying a first display data signal representing (m+n) grades, obtained by adding m grades represented by a second display data signal externally input and an adjustable range n. The data-side driving circuit is capable of outputting modulation voltages having (m+n) types of amplitudes to a plurality of first electrodes in accordance with a first display data signal. The amplitude of the modulation voltage corresponding to the light emission characteristic of a prescribed light emitting layer among a plurality of light emitting layers is adjusted to an amplitude in the adjustable range n from the amplitude corresponding to the grade represented by the second display data signal.
    Type: Application
    Filed: September 26, 2002
    Publication date: July 17, 2003
    Inventors: Hisashi Yamaguchi, Kyouichi Yamamoto
  • Publication number: 20030081278
    Abstract: While modules to be tested in one constant temperature oven are tested by providing a plurality of constant temperature ovens, accommodating a plurality of modules to be tested in each constant temperature oven and connecting the modules to be tested accommodated in a plurality of constant temperature ovens to the measuring instruments via the switches, preparation for testing such as temperature change of the other constant temperature oven is conducted and the modules to be tested in one constant temperature oven are tested using measuring instruments. Thereafter, the switches are changed over and the modules to be tested accommodated in the other constant temperature oven are tested. Thereby, expensive measuring instruments can be used effectively.
    Type: Application
    Filed: April 2, 2002
    Publication date: May 1, 2003
    Applicant: OpNext Japan, Inc.
    Inventors: Norio Chujo, Kosuke Inoue, Tomoaki Shimotsu, Atsushi Hasegawa, Takeshi Yamashita, Hideyuki Kuwano, Ryozo Sato, Katsumi Uchida, Ikuo Kawaguchi, Kyouichi Yamamoto, Takashi Minato
  • Patent number: D322603
    Type: Grant
    Filed: February 28, 1989
    Date of Patent: December 24, 1991
    Assignee: Sharp Corporation
    Inventors: Hisashi Uede, Hiroshi Kishishita, Akio Inohara, Kyouichi Yamamoto, Ikuo Ogawa