Patents by Inventor Kyu-nam Choi

Kyu-nam Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240075318
    Abstract: The present disclosure relates to a method for carrying out dose delivery quality assurance for high-precision radiation treatment, in which parameters affecting a pass rate of dose delivery quality assurance can be derived through regression analysis, which is a known statistical analysis method, and a pass rate prediction model capable of predicting each parameter and the pass rate of dose delivery quality assurance can be derived, and accordingly, it can be predicted in advance whether dose delivery quality assurance will be passed according to the parameters through the above prediction model, without repeatedly carrying out dose delivery quality assurance according to a patient's treatment plan, and as a result, the efficiency of dose delivery quality assurance can be enhanced, and the time or capacity required for such quality assurance is reduced, such that radiation treatment for an actual patient can be quickly and precisely carried out.
    Type: Application
    Filed: December 22, 2021
    Publication date: March 7, 2024
    Inventors: Young Nam KANG, Ji Na KIM, Hong Seok JANG, Byung Ock CHOI, Yun Ji SEOL, Tae Geon OH, Na Young AN, Jae Hyeon LEE, Kyu Min HAN, Ye Rim SHIN
  • Patent number: 7538750
    Abstract: A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.
    Type: Grant
    Filed: September 27, 2004
    Date of Patent: May 26, 2009
    Assignee: Samsung Electronics Co., Ltd
    Inventors: Jae-wan Kim, Hyoung-jo Jeon, Yong-sik Douglas Kim, Hwa-sub Shim, Heong-min Ahn, Ho-seok Choi, Myung-ho Jung, Min Hong, Joung-hag Kim, Young-su Ryu, Sung-chai Kim, Seung-gun Byoun, Suk-in Yoo, Kyu-nam Choi, Jae-yeong Lee
  • Publication number: 20050151760
    Abstract: A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.
    Type: Application
    Filed: September 27, 2004
    Publication date: July 14, 2005
    Inventors: Jae-wan Kim, Hyoung-jo Jeon, Yong-sik Kim, Hwa-sub Shim, Hyeongmin Ahn, Ho-seok Choi, Myung-ho Jung, Min Hong, Joung-hag Kim, Young-su Ryu, Sung-chai Kim, Seung-gun Byoun, Suk-in Yoo, Kyu-nam Choi, Jae-yeong Lee