Patents by Inventor Larry Denneau

Larry Denneau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7079251
    Abstract: A multi-channel imaging system is calibrated by measuring the geometric distortion in each sub-image, generating corresponding correction factors, and applying such factors to correct subsequent image data. In addition, intensity transfer-function arrays are measured at each pixel, and further used to correct for system and detector nonlinearities and nonuniformity between images. The procedure is repeated over a range of wavelengths to produce a complete set of correction coefficients and transfer functions. When the system is used for interferometric phase measurements, multiple measurements are preferably taken and a random phase offset in the reference path length is introduced at each measurement. The multiple phase data so derived are then averaged to reduce phase-dependent systematic measurement errors.
    Type: Grant
    Filed: October 16, 2003
    Date of Patent: July 18, 2006
    Assignee: 4D Technology Corporation
    Inventors: James E. Millerd, Neal J. Brock, Larry Denneau, Jr.
  • Publication number: 20050083531
    Abstract: A multi-channel imaging system is calibrated by measuring the geometric distortion in each sub-image, generating corresponding correction factors, and applying such factors to correct subsequent image data. In addition, intensity transfer-function arrays are measured at each pixel, and further used to correct for system and detector nonlinearities and nonuniformity between images. The procedure is repeated over a range of wavelengths to produce a complete set of correction coefficients and transfer functions. When the system is used for interferometric phase measurements, multiple measurements are preferably taken and a random phase offset in the reference path length is introduced at each measurement. The multiple phase data so derived are then averaged to reduce phase-dependent systematic measurement errors.
    Type: Application
    Filed: October 16, 2003
    Publication date: April 21, 2005
    Inventors: James Millerd, Neal Brock, Larry Denneau
  • Patent number: 5717782
    Abstract: A method for correcting a height map produced by an optical height profiler while scanning a target surface. Regions of bad data are identified and erroneous height values are replaced with provisional height values based selected from neighboring valid height values. Each provisional height value is also assigned a position index corresponding to its proximity to the boundary of the region. Starting from the interior of the region, the technique then replaces each provisional height value with a corrected height value calculated by interpolation of valid height values as a function of distance from the boundary as represented by the position indices. The resulting corrected height map is suitable for on-line visual display.
    Type: Grant
    Filed: November 14, 1994
    Date of Patent: February 10, 1998
    Assignee: Wyko Corporation
    Inventor: Larry Denneau, Jr.