Abstract: Processes for conversion of propylene polyol feed into useful petrochemical products, including olefin monomers, are described. Such processes comprise: adding a feed stream comprising one or more propylene polyols to a dehydration cleavage reaction zone in the presence of a dehydration cleavage catalyst and reacting at a pressure and temperature sufficient to form a product stream comprising propionaldehyde, a dioxolane component, and a dioxane component; and adding the product stream and hydrogen to a dehydration reaction zone in the presence of a hydrogenation catalyst to form and reacting at a pressure and temperature sufficient to form a second product stream comprising a propanol component. The second product can be added to a dehydration reaction zone in the presence of a dehydration catalyst and reacted at a pressure and temperature sufficient to form a third product stream comprising propylene.

Abstract: Processes for conversion of propylene polyol feed into useful petrochemical products, including olefin monomers, are described. Such processes comprise: adding a feed stream comprising one or more propylene polyols, hydrogen, and optionally water, to a catalytic conversion reaction zone in the presence of a first solid acid catalyst component and a hydrogenation catalyst component and reacting at a pressure and temperature sufficient to form a first product stream comprising a propanol component. The first product stream can be added to a dehydration reaction zone in the presence of a dehydration catalyst and reacted at a pressure and temperature sufficient to form a second product stream comprising propylene.

Abstract: A modular integrated circuit test fixture integrates the integrated circuit (IC) handler to IC test fixture alignment interface (the alignment plate) into a daughter card subassembly, which reduces the overall rejection rate of devices due to alignment errors. The test fixture has a plurality of daughter card subassemblies for receiving integrated circuits for testing. Each daughter card subassembly is independently removable from the test fixture and includes a daughter card for a particular size and type of integrated circuit, a plurality of sockets electrically and mechanically coupled to the daughter card to receive respective integrated circuits for testing, and an alignment plate to provide alignment between an IC handler and respective ones of the daughter card subassemblies and to provide alignment for one or more manual test lids. The manual test lids are removed for automatic testing using an IC handler.

Abstract: A modular integrated circuit test fixture integrates the integrated circuit (IC) handler to IC test fixture alignment interface (the alignment plate) into a daughter card subassembly, which reduces the overall rejection rate of devices due to alignment errors. The test fixture has a plurality of daughter card subassemblies for receiving integrated circuits for testing. Each daughter card subassembly is independently removable from the test fixture and includes a daughter card for a particular size and type of integrated circuit, a plurality of sockets electrically and mechanically coupled to the daughter card to receive respective integrated circuits for testing, and an alignment plate to provide alignment between an IC handler and respective ones of the daughter card subassemblies and to provide alignment for one or more manual test lids. The manual test lids are removed for automatic testing using an IC handler.

Abstract: A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main test printed circuit board (PCB) and a daughter card that is dedicated to a specific device handler and/or a specific package type that can be different from the main test PCB. A pogo block is inserted into a thick frame with an alignment plate for contactor use in which a device under test fits into a recess in the frame through an alignment plate to align the device under test to make contact with electrical contacts of the contactor. The frame and guide plate can be removed and a thinner frame coupled to the contactor, which changes its function to a pogo block assembly.

Abstract: A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main test printed circuit board (PCB) and a daughter card that is dedicated to a specific device handler and/or a specific package type that can be different from the main test PCB. A pogo block is inserted into a thick frame with an alignment plate for contactor use in which a device under test fits into a recess in the frame through an alignment plate to align the device under test to make contact with electrical contacts of the contactor. The frame and guide plate can be removed and a thinner frame coupled to the contactor, which changes its function to a pogo block assembly.