Patents by Inventor Larry Wayne Akers

Larry Wayne Akers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thermal control system for an automated test system
    Patent number: 11754622
    Abstract: An example test system includes test sites for testing devices under test (DUTs), where the test sites include a test site configured to hold a DUT for testing. The test system includes a thermal control system to control a temperature of the DUT separately from control over temperatures of other DUTs in other test sites. The thermal control system includes a thermoelectric cooler (TEC) and a structure that is thermally conductive. The TEC is in thermal communication with the DUT to control the temperature of the DUT by transferring heat between the DUT and the structure.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: September 12, 2023
    Assignee: TERADYNE, INC.
    Inventors: Larry Wayne Akers, Michael O. Mckenna
  • THERMAL CONTROL SYSTEM FOR AN AUTOMATED TEST SYSTEM
    Publication number: 20220128625
    Abstract: An example test system includes test sites for testing devices under test (DUTs), where the test sites include a test site configured to hold a DUT for testing. The test system includes a thermal control system to control a temperature of the DUT separately from control over temperatures of other DUTs in other test sites. The thermal control system includes a thermoelectric cooler (TEC) and a structure that is thermally conductive. The TEC is in thermal communication with the DUT to control the temperature of the DUT by transferring heat between the DUT and the structure.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Larry Wayne Akers, Michael O. Mckenna