Abstract: A preferred embodiment of the invention provides an ultra-soft atomic force microscope device that has a nanoneedle cantilever that terminates in a smaller diameter nanofiber tip. Deflection of the nanoneedle cantilever is measured directly by a laser Doppler vibrometer. The invention simultaneously provides a very low mass nanoneedle cantilever arm with a very small diameter nanofiber tip, while being able to image the vibration and displacement. An AFM device of the invention simultaneously provides a ultra low mass and soft cantilever, the ability to accurately and directly measure vibration and deflection of the very small diameter nanoneedle cantilever with the laser Doppler vibrometer, and a sharp nanofiber tip that provides sub nanometer resolution.