Abstract: A low level contact resistance (LLCR) testing apparatus comprises a test board, an interface board, and a patch board. The test board comprises a processor socket. The interface board connects to both the test board and the patch board. The patch board connects to a contact resistance tester. An LLCR system comprising the LLCR testing apparatus and a contact resistance tester can be portable. The test board can accommodate thermal management solutions of varying sizes and types. Different test board designs can accommodate different socket-processor configurations and the different test boards can be easily accommodated by an LLCR testing apparatus due to its modular design.

Abstract: A voltage controlled oscillator (VCO), including: at least one second upper voltage rail; at least one second lower voltage rail; a ring of N cascaded inverters, wherein the set of N cascaded inverters are coupled between the at least one second upper voltage rail and the at least one second lower voltage rail; at least one first frequency band select circuit coupled between first upper voltage rail and the at least one second upper voltage rail; at least one second frequency band select circuit coupled between the at least one second lower voltage rail and first lower voltage rail; at least one first VCO frequency control circuit coupled between the first upper voltage rail and the at least one second upper voltage rail; and at least one second VCO frequency control circuit coupled between the at least one second lower voltage rail and the first lower voltage rail.