Patents by Inventor Lelan D. Warren

Lelan D. Warren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11479420
    Abstract: A tote accumulator includes stack retaining latches that are configured to be acted on by a cam and follower mechanism and additionally by a holding mechanism. The cam and follower mechanism is configured to act on the stack retaining latches when the stack of totes is moved vertically by a lifting member, to move the stack retaining latches into an active dwell wherein the stack retaining latches are engaged with the stack of totes. The holding mechanism is configured to be activated to extend the active dwell after the cam and follower mechanism ceases to act on the stack retaining latches. The active dwell is extended even further by a mechanical interlocking feature between the latches and the totes. In various implementations, the design of the cam and follower arrangement and the activation timing of the holding mechanism may be adapted to execute a stacking or an unstacking operation.
    Type: Grant
    Filed: August 4, 2020
    Date of Patent: October 25, 2022
    Assignee: Körber Supply Chain LLC
    Inventor: Lelan D. Warren
  • Publication number: 20210061589
    Abstract: A tote accumulator includes stack retaining latches that are configured to be acted on by a cam and follower mechanism and additionally by a holding mechanism. The cam and follower mechanism is configured to act on the stack retaining latches when the stack of totes is moved vertically by a lifting member, to move the stack retaining latches into an active dwell wherein the stack retaining latches are engaged with the stack of totes. The holding mechanism is configured to be activated to extend the active dwell after the cam and follower mechanism ceases to act on the stack retaining latches. The active dwell is extended even further by a mechanical interlocking feature between the latches and the totes. In various implementations, the design of the cam and follower arrangement and the activation timing of the holding mechanism may be adapted to execute a stacking or an unstacking operation.
    Type: Application
    Filed: August 4, 2020
    Publication date: March 4, 2021
    Inventor: Lelan D. Warren
  • Patent number: 9637263
    Abstract: Methods and tools for opening polyfilm-wrapped packages. A tool includes a rubbing surface and a motor configured to move the rubbing surface. The tool includes a power source connected to supply power to the rubbing surface. The rubbing surface is applied to the polyfilm wrapping while being moved to create an opening in the polyfilm wrapping caused at least in part by friction heat. The opening is created without damaging contents of the package.
    Type: Grant
    Filed: October 18, 2011
    Date of Patent: May 2, 2017
    Assignee: SIEMENS INDUSTRY, INC.
    Inventors: Homer L. Dickerson, James M. Pippin, Lelan D. Warren
  • Publication number: 20120096817
    Abstract: Methods and tools for opening polyfilm-wrapped packages. A tool includes a rubbing surface and a motor configured to move the rubbing surface. The tool includes a power source connected to supply power to the rubbing surface. The rubbing surface is applied to the polyfilm wrapping while being moved to create an opening in the polyfilm wrapping caused at least in part by friction heat. The opening is created without damaging contents of the package.
    Type: Application
    Filed: October 18, 2011
    Publication date: April 26, 2012
    Applicant: SIEMENS INDUSTRY, INC.
    Inventors: Homer L. Dickerson, James M. Pippin, Lelan D. Warren
  • Patent number: 6900459
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Grant
    Filed: December 5, 2002
    Date of Patent: May 31, 2005
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Publication number: 20030088973
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Application
    Filed: December 5, 2002
    Publication date: May 15, 2003
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Patent number: 6492187
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Grant
    Filed: August 30, 2000
    Date of Patent: December 10, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Patent number: 6353312
    Abstract: A method for positioning a semiconductor die within a temporary package, including forming a representation of at least a portion of a semiconductor die, moving the semiconductor die to a location proximate a temporary package, and comparing the representation of the at least a portion of the semiconductor die to a representation of at least a portion of the temporary package. The compared representations are then used to define movement of a die moving assembly, in order to move the die to place the semiconductor die and the temporary package into a desired relationship to one another. A restraining device is then secured to the temporary package to retain the semiconductor die in the desired relationship to the temporary package.
    Type: Grant
    Filed: January 20, 1999
    Date of Patent: March 5, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Jennifer L. Folaron, Robert J. Folaron, John O. Jacobson, David R. Hembree, Jay C. Nelson, Lelan D. Warren
  • Patent number: 6210984
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Grant
    Filed: September 20, 1999
    Date of Patent: April 3, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Patent number: 6150828
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Grant
    Filed: September 20, 1999
    Date of Patent: November 21, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Patent number: 6064194
    Abstract: An apparatus for automatically positioning electronic dice within temporary packages to enable continuity testing between the dice bond pads and the temporary package electrical interconnects is provided. The apparatus includes a robot having a programmable robot arm with a gripper assembly, die and lid feeder stations, a die inverter, and a plurality of cameras. The cameras take several pictures of the die and temporary packages to precisely align the die bond pads with the temporary package electrical interconnects. A predetermined assembly position is located along a conveyor that conveys a carrier between a first position, corresponding to an inlet, and a second position, corresponding to an outlet. The die, a restraining device and temporary package are assembled at the predetermined assembly position and tested for continuity therebetween. The apparatus further includes a fifth camera which locates the die at a wafer handler.
    Type: Grant
    Filed: December 17, 1996
    Date of Patent: May 16, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Jennifer L. Folaron, Robert J. Folaron, David R. Hembree, John O. Jacobson, Jay C. Nelson, Lelan D. Warren
  • Patent number: 5955877
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
    Type: Grant
    Filed: October 13, 1998
    Date of Patent: September 21, 1999
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren
  • Patent number: 5894218
    Abstract: A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of die to establish known good dice (KGD).
    Type: Grant
    Filed: August 7, 1996
    Date of Patent: April 13, 1999
    Assignee: Micron Technology, Inc.
    Inventors: Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron, Robert J. Folaron, Jay C. Nelson, Lelan D. Warren