Abstract: A method for determining the quality of a crimped connection between a conductor and a contact includes operating a crimping device to exert a crimping force on the conductor and the contact. From the crimping force curve that occurs during the crimping, a normalized force-distance crimping force curve is derived and a compression area is determined which lies under a reference crimping force curve. The crimping force curve and the reference crimping force curve are subdivided into several zones, the subdivision taking place under consideration of the size of the compression area. A further area that lies under the crimping force curve is determined and used to infer the quality of the crimped connection. A device for performing the method is provided.

Abstract: A method for determining the quality of a crimped connection between a conductor and a contact includes operating a crimping device to exert a crimping force on the conductor and the contact. From the crimping force curve that occurs during the crimping, a normalized force-distance crimping force curve is derived and a compression area is determined which lies under a reference crimping force curve. The crimping force curve and the reference crimping force curve are subdivided into several zones, the subdivision taking place under consideration of the size of the compression area. A further area that lies under the crimping force curve is determined and used to infer the quality of the crimped connection. A device for performing the method is provided.