Patents by Inventor Leon Musil

Leon Musil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6684349
    Abstract: A system and method for reliability assessment and prediction of end items is provided herein. A reliability assessment program (RAP) in accordance with the present invention provides a reliability assessment of the new equipment and/or parts designed for in-field use by assessing the similarities and differences between the new equipment and the predecessor equipment. Predecessor end item field failure data is collected and analyzed to compare the degree of similarity between the predecessor fielded end item and the new design. Based on this comparison, an appropriate method of assessment is determined, for example, a similarity analysis process or a failure cause model. Both methods use models for comparison and generate an appropriate report expressing the failure rate prediction of the new design and/or the mean-time-between-failure (MTBF).
    Type: Grant
    Filed: January 18, 2001
    Date of Patent: January 27, 2004
    Assignee: Honeywell International Inc.
    Inventors: Louis J. Gullo, Leon Musil, Bruce G. Johnson
  • Publication number: 20020078403
    Abstract: A system and method for reliability assessment and prediction of end items is provided herein. A reliability assessment program (RAP) in accordance with the present invention provides a reliability assessment of the new equipment and/or parts designed for in-field use by assessing the similarities and differences between the new equipment and the predecessor equipment. Predecessor end item field failure data is collected and analyzed to compare the degree of similarity between the predecessor fielded end item and the new design. Based on this comparison, an appropriate method of assessment is determined, for example, a similarity analysis process or a failure cause model. Both methods use models for comparison and generate an appropriate report expressing the failure rate prediction of the new design and/or the mean-time-between-failure (MTBF).
    Type: Application
    Filed: January 18, 2001
    Publication date: June 20, 2002
    Inventors: Louis J. Gullo, Leon Musil, Bruce G. Johnson