Patents by Inventor Li Danhong

Li Danhong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Small spot and high energy resolution XRF system for valence state determination
    Patent number: 7899154
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 1, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Li Danhong
  • SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION
    Publication number: 20100046702
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Application
    Filed: March 14, 2008
    Publication date: February 25, 2010
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, Li Danhong