Patents by Inventor Lian Yao

Lian Yao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11988664
    Abstract: An immunochromatographic detection device adapted for detecting an analyte in a specimen includes a surface-modified cellulose membrane, a detection unit, and a substrate. The surface-modified cellulose membrane includes opposite top and bottom surfaces, cellulose fibers, and an anti-biofouling acrylic copolymer that is bonded to the cellulose fibers. The detection unit is disposed on the top surface of the cellulose membrane, is configured to interact with the specimen, and includes a diffusion layer, a capturing layer, a detection layer, a control line layer, and an absorbent layer. The substrate is disposed on the bottom surface of the surface-modified cellulose membrane.
    Type: Grant
    Filed: November 15, 2022
    Date of Patent: May 21, 2024
    Assignee: SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Ying-Nien Chou, Mei-Lian Yao
  • Publication number: 20230176046
    Abstract: An immunochromatographic detection device adapted for detecting an analyte in a specimen includes a surface-modified cellulose membrane, a detection unit, and a substrate. The surface-modified cellulose membrane includes opposite top and bottom surfaces, cellulose fibers, and an anti-biofouling acrylic copolymer that is bonded to the cellulose fibers. The detection unit is disposed on the top surface of the cellulose membrane, is configured to interact with the specimen, and includes a diffusion layer, a capturing layer, a detection layer, a control line layer, and an absorbent layer. The substrate is disposed on the bottom surface of the surface-modified cellulose membrane.
    Type: Application
    Filed: November 15, 2022
    Publication date: June 8, 2023
    Inventors: Ying-Nien CHOU, Mei-Lian YAO
  • Patent number: 7747062
    Abstract: Methods, defect review tools, and systems for locating a defect in a defect review process are provided. One method includes acquiring one or more images and data from an inspection tool. The one or more images illustrate an area on a specimen in which a defect to be reviewed is located. The data indicates a position and features of the defect within the area. The method also includes acquiring one or more additional images of the specimen proximate the position of the defect indicated in the data using an imaging subsystem of a defect review tool. In addition, the method includes identifying a portion of the one or more additional images that corresponds to the one or more images. The method further includes determining a position of the defect within the portion of the one or more additional images using the data.
    Type: Grant
    Filed: November 9, 2005
    Date of Patent: June 29, 2010
    Assignee: KLA-Tencor Technologies Corp.
    Inventors: Da Chen, Christophe Fouquet, Saibal Banerjee, Santosh Bhattacharyya, Joe Wang, Lian Yao, Mike van Riet, Igor Germanenko
  • Publication number: 20080032429
    Abstract: Methods, defect review tools, and systems for locating a defect in a defect review process are provided. One method includes acquiring one or more images and data from an inspection tool. The one or more images illustrate an area on a specimen in which a defect to be reviewed is located. The data indicates a position and features of the defect within the area. The method also includes acquiring one or more additional images of the specimen proximate the position of the defect indicated in the data using an imaging subsystem of a defect review tool. In addition, the method includes identifying a portion of the one or more additional images that corresponds to the one or more images. The method further includes determining a position of the defect within the portion of the one or more additional images using the data.
    Type: Application
    Filed: November 9, 2005
    Publication date: February 7, 2008
    Inventors: Da Chen, Christophe Fouquet, Saibal Banerjee, Santosh Bhattacharyya, Joe Wang, Lian Yao, Mike van Riet, Igor Germanenko