Abstract: A method of generating an IC layout diagram includes receiving an IC layout diagram including a gate region and a gate via, the gate via being positioned at a location within an active region and along a width of the gate region extending across the active region, receiving a first gate resistance value of the gate region, retrieving a second gate resistance value from a resistance value reference based on the location and the width, using the first and second resistance values to determine that the IC layout diagram does not comply with a design specification, and based on the non-compliance with the design specification, modifying the IC layout diagram.

Abstract: An air-blown cleaning system for cleaning a photomask includes an image capturing module, an identification and control module, and an air knife device. The image capturing module captures an image of the photomask and divided the image into a plurality of sections for the identification and control module to identify particular sections with contaminants for subsequent cleaning and to store such data into a database. The air knife device includes at least one air knife module which receives data from the database and controls the air knife module to air blow the particular sections with contaminants. The instant disclosure also includes a method of air blow cleaning for cleaning a photomask.

Abstract: An air-blown cleaning system for cleaning a photomask includes an image capturing module, an identification and control module, and an air knife device. The image capturing module captures an image of the photomask and divided the image into a plurality of sections for the identification and control module to identify particular sections with contaminants for subsequent cleaning and to store such data into a database. The air knife device includes at least one air knife module which receives data from the database and controls the air knife module to air blow the particular sections with contaminants. The instant disclosure also includes a method of air blow cleaning for cleaning a photomask.

Abstract: A current-amplifying logarithmic mode CMOS image sensor having a first MOS transistor, a second MOS transistor, a third MOS transistor and a sensing device. The gate terminal and the first connection terminal of the first MOS transistor are tied to a high voltage terminal. The gate terminal of the second MOS transistor and the second connection terminal of the first MOS transistor are tied to a node point. The first connection terminal of the second MOS transistor is tied to the high voltage terminal. The gate terminal of the third MOS transistor is tied to a row select signal. The first connection terminal of the third MOS transistor is tied to the second connection terminal of the second MOS transistor. The second terminal of the third MOS transistor serves as a voltage output terminal. The sensing device includes a PMOS transistor and a lateral bipolar junction transistor.

Abstract: A logarithmic mode CMOS image sensor capable of eliminating in-pixel fixed pattern noise. The image sensor includes a first MOS transistor, a second MOS transistor, a third MOS transistor, a fourth MOS transistor, a photodiode and a current source. The gate terminal of the first MOS transistor and the first connection terminal are tied at a first node point. The first node point is connected to a terminal with the highest voltage in the circuit. The gate terminal of the second MOS transistor and the second connection terminal of the first MOS transistor are tied at a second node point. The first connection terminal of the second MOS transistor is also connected to the terminal with the highest voltage. The gate terminal of the third MOS transistor is tied to a row select signal terminal and the first connection terminal of the third MOS transistor is tied to the second terminal of the second MOS transistor. The second connection terminal of the third MOS transistor is a voltage output terminal.