Abstract: Optical communication modules, optical communication cables, and associated methods of manufacturing are provided. An example optical communication module includes a substrate supporting a first optical transceiver and a second optical transceiver. The first optical transceiver includes a first optical transmitter that generates optical signals having a first wavelength and a first optical receiver that receives optical signals having a second wavelength. The second optical transceiver includes a second optical transmitter that generates optical signals having the second wavelength and a second optical receiver that receives optical signals having the first wavelength. One or more lens assemblies coupled with the respective transceivers may be used to direct optical signal generated by and directed to the respective transceivers.

Abstract: A transducer reliability testing and VCSEL failure prediction method are provided. The method includes applying a testing temperature and a constant current to a VCSEL for a testing time. The method monitors a forward voltage of the VCSEL and determines if a first change in forward voltage is above a first predetermined threshold over the testing time and if a second change in forward voltage is above a second predetermined threshold over a portion of the testing time. The method determines failure of the VCSEL if either of these predetermined thresholds are exceeded. The method determines passage of the VCSEL if the first change in the forward voltage and the second change in the forward voltage are both below the first predetermined threshold and the second predetermined threshold, respectively.

Abstract: A transducer reliability testing and VCSEL failure prediction method are provided. The method includes applying a testing temperature and a constant current to a VCSEL for a testing time. The method monitors a forward voltage of the VCSEL and determines if a first change in forward voltage is above a first predetermined threshold over the testing time and if a second change in forward voltage is above a second predetermined threshold over a portion of the testing time. The method determines failure of the VCSEL if either of these predetermined thresholds are exceeded. The method determines passage of the VCSEL if the first change in the forward voltage and the second change in the forward voltage are both below the first predetermined threshold and the second predetermined threshold, respectively.