Patents by Inventor Locke Christman

Locke Christman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for enhancing yield of secondary ions
    Patent number: 6414307
    Abstract: The sensitivity of a secondary ion mass spectrometer (SIMS) is increased by using water vapor to enhance the yield of positive secondary ions sputtered by a primary focused ion beam. Water vapor is injected through a needle that is positioned close to the sample and electrically biased to reduce interference with secondary ion collection field. The sensitivity is enhanced for metals in particular, which tend to be sputtered as positive ions.
    Type: Grant
    Filed: July 9, 1999
    Date of Patent: July 2, 2002
    Assignee: FEI Company
    Inventors: Robert L. Gerlach, Locke Christman, Mark Utlaut