Patents by Inventor Lok Ping Ho

Lok Ping Ho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • LUMINESCENCE METHOD FOR THE IN-LINE DETECTION OF ATOMIC SCALE DEFECTS DURING FABRICATION OF 4H-SIC DIODES
    Publication number: 20240128129
    Abstract: A method of detecting atomic scale defects in semiconductors, comprising the steps of scanning the surface of the semiconductor with a field emission scanning electron microscope (SEM) to form an SEM image thereof; scanning the SEM image with a light detector and monochromator to obtain a cathodoluminescence (CL) spatial intensity map of the SEM image; determining the CL spectra, i.e.
    Type: Application
    Filed: October 5, 2023
    Publication date: April 18, 2024
    Applicant: THE UNIVERSITY OF HONG KONG
    Inventors: Chi Chung Francis Ling, Sihua Li, Lok Ping Ho, Wing Chong Tony Chau